Abstract
Current-voltage behavior is studied experimentally in a Hg0.78Cd0.22Te-CdTe-Hg0.78Cd0.22Te heterostructure grown by molecular beam epitaxy. At temperatures above 160 K, energy-band diagrams suggest that the dominant low-bias current is thermionic hole emission across the CdTe barrier layer. This interpretation yields a direct determination of 390±75 meV for the HgTe-CdTe valence-band discontinuity at 300 K. Similar analyses of current-voltage data taken at 190–300 K suggest that the valence-band offset decreases at low temperatures in this heterojunction.
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 8:48 a.m.) |
Deposited | 1 year, 7 months ago (Feb. 2, 2024, 5:14 p.m.) |
Indexed | 1 year, 7 months ago (Feb. 2, 2024, 6:59 p.m.) |
Issued | 37 years, 8 months ago (Dec. 28, 1987) |
Published | 37 years, 8 months ago (Dec. 28, 1987) |
Published Print | 37 years, 8 months ago (Dec. 28, 1987) |
@article{Chow_1987, title={Electrical determination of the valence-band discontinuity in HgTe-CdTe heterojunctions}, volume={51}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.98949}, DOI={10.1063/1.98949}, number={26}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Chow, D. H. and McCaldin, J. O. and Bonnefoi, A. R. and McGill, T. C. and Sou, I. K. and Faurie, J. P.}, year={1987}, month=dec, pages={2230–2232} }