Abstract
All β-SiC films grown using on-axis (001) Si substrates that have been examined with transmission electron microscopy exhibit a high density of interfacial twins, stacking faults, and antiphase disorder. The antiphase boundaries can be decorated by chemical etching, sputter etching, wet oxidation, and β-SiC growth in the presence of diborane. All traces of antiphase disorder are eliminated when the heteroepitaxial growth is carried out on vicinal (001) Si substrates that are tilted 2° about a 〈110〉 axis. In addition, growth on the off-axis Si produces β-SiC films that are significantly smoother than on-axis films. The density of stacking faults is apparently unaffected by growth on the off-axis substrates.
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 8:48 a.m.) |
Deposited | 1 year, 6 months ago (Feb. 2, 2024, 5 p.m.) |
Indexed | 1 year, 6 months ago (Feb. 11, 2024, 2:57 a.m.) |
Issued | 37 years, 11 months ago (Sept. 14, 1987) |
Published | 37 years, 11 months ago (Sept. 14, 1987) |
Published Print | 37 years, 11 months ago (Sept. 14, 1987) |
@article{Powell_1987, title={Improved β-SiC heteroepitaxial films using off-axis Si substrates}, volume={51}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.98824}, DOI={10.1063/1.98824}, number={11}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Powell, J. A. and Matus, L. G. and Kuczmarski, M. A. and Chorey, C. M. and Cheng, T. T. and Pirouz, P.}, year={1987}, month=sep, pages={823–825} }