Crossref journal-article
AIP Publishing
Applied Physics Letters (317)
Abstract

All β-SiC films grown using on-axis (001) Si substrates that have been examined with transmission electron microscopy exhibit a high density of interfacial twins, stacking faults, and antiphase disorder. The antiphase boundaries can be decorated by chemical etching, sputter etching, wet oxidation, and β-SiC growth in the presence of diborane. All traces of antiphase disorder are eliminated when the heteroepitaxial growth is carried out on vicinal (001) Si substrates that are tilted 2° about a 〈110〉 axis. In addition, growth on the off-axis Si produces β-SiC films that are significantly smoother than on-axis films. The density of stacking faults is apparently unaffected by growth on the off-axis substrates.

Bibliography

Powell, J. A., Matus, L. G., Kuczmarski, M. A., Chorey, C. M., Cheng, T. T., & Pirouz, P. (1987). Improved β-SiC heteroepitaxial films using off-axis Si substrates. Applied Physics Letters, 51(11), 823–825.

Authors 6
  1. J. A. Powell (first)
  2. L. G. Matus (additional)
  3. M. A. Kuczmarski (additional)
  4. C. M. Chorey (additional)
  5. T. T. Cheng (additional)
  6. P. Pirouz (additional)
References 18 Referenced 63
  1. 10.1063/1.93970 / Appl. Phys. Lett. (1983)
  2. 10.1063/1.94973 / Appl. Phys. Lett. (1984)
  3. 10.1149/1.2113921 / J. Electrochem. Soc. (1985)
  4. {'key': '2024020221392177100_r4'}
  5. 10.1016/0022-0248(86)90158-2 / J. Cryst. Growth (1986)
  6. 10.1063/1.97661 / Appl. Phys. Lett. (1987)
  7. 10.1063/1.97667 / Appl. Phys. Lett. (1987)
  8. {'key': '2024020221392177100_r8', 'first-page': '404', 'volume': 'EDL-7', 'year': '1986', 'journal-title': 'IEEE Electron Device Lett.'} / IEEE Electron Device Lett. (1986)
  9. {'key': '2024020221392177100_r9', 'first-page': '692', 'volume': 'EDL-7', 'year': '1986', 'journal-title': 'IEEE Electron Device Lett.'} / IEEE Electron Device Lett. (1986)
  10. {'key': '2024020221392177100_r10'}
  11. {'key': '2024020221392177100_r11', 'first-page': '48', 'volume': 'EDL-8', 'year': '1987', 'journal-title': 'IEEE Electron Device Lett.'} / IEEE Electron Device Lett. (1987)
  12. 10.1107/S0021889882011352 / J. Appl. Crystallogr. (1982)
  13. {'key': '2024020221392177100_r13'}
  14. 10.1143/JJAP.25.L285 / Jpn. J. Appl. Phys. (1986)
  15. {'key': '2024020221392177100_r15'}
  16. 10.1149/1.2100708 / J. Electrochem. Soc. (1987)
  17. {'key': '2024020221392177100_r17', 'first-page': '668', 'volume': '1', 'year': '1983', 'journal-title': 'J. Vac. Sci. Technol. B'} / J. Vac. Sci. Technol. B (1983)
  18. 10.1016/0039-6028(80)90052-7 / Surf. Sci. (1980)
Dates
Type When
Created 23 years, 1 month ago (July 26, 2002, 8:48 a.m.)
Deposited 1 year, 6 months ago (Feb. 2, 2024, 5 p.m.)
Indexed 1 year, 6 months ago (Feb. 11, 2024, 2:57 a.m.)
Issued 37 years, 11 months ago (Sept. 14, 1987)
Published 37 years, 11 months ago (Sept. 14, 1987)
Published Print 37 years, 11 months ago (Sept. 14, 1987)
Funders 0

None

@article{Powell_1987, title={Improved β-SiC heteroepitaxial films using off-axis Si substrates}, volume={51}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.98824}, DOI={10.1063/1.98824}, number={11}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Powell, J. A. and Matus, L. G. and Kuczmarski, M. A. and Chorey, C. M. and Cheng, T. T. and Pirouz, P.}, year={1987}, month=sep, pages={823–825} }