Abstract
Device quality (110)GaAs has been reproducibly grown by molecular beam epitaxy (MBE) for the first time. Angling of the substrate to expose stable, Ga-rich ledges on the (110) surface has been shown to be the necessary condition for two-dimensional growth. The layers exhibit a room-temperature electron mobility of ∼5700 cm2/V s for NSi∼4×1015 and a strong exciton photoluminescence emission at 4 K. This breakthrough in MBE growth of III-V compounds allows for fabrication of (110) GaAs devices which will take advantage of the unique properties of this orientation.
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@article{Allen_1987, title={Device quality growth and characterization of (110) GaAs grown by molecular beam epitaxy}, volume={51}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.98329}, DOI={10.1063/1.98329}, number={9}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Allen, L. T. P. and Weber, E. R. and Washburn, J. and Pao, Y. C.}, year={1987}, month=aug, pages={670–672} }