Crossref journal-article
AIP Publishing
Applied Physics Letters (317)
Abstract

Device quality (110)GaAs has been reproducibly grown by molecular beam epitaxy (MBE) for the first time. Angling of the substrate to expose stable, Ga-rich ledges on the (110) surface has been shown to be the necessary condition for two-dimensional growth. The layers exhibit a room-temperature electron mobility of ∼5700 cm2/V s for NSi∼4×1015 and a strong exciton photoluminescence emission at 4 K. This breakthrough in MBE growth of III-V compounds allows for fabrication of (110) GaAs devices which will take advantage of the unique properties of this orientation.

Bibliography

Allen, L. T. P., Weber, E. R., Washburn, J., & Pao, Y. C. (1987). Device quality growth and characterization of (110) GaAs grown by molecular beam epitaxy. Applied Physics Letters, 51(9), 670–672.

Authors 4
  1. L. T. P. Allen (first)
  2. E. R. Weber (additional)
  3. J. Washburn (additional)
  4. Y. C. Pao (additional)
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Dates
Type When
Created 23 years, 1 month ago (July 26, 2002, 8:48 a.m.)
Deposited 1 year, 7 months ago (Feb. 2, 2024, 4:59 p.m.)
Indexed 1 year ago (Aug. 11, 2024, 12:30 p.m.)
Issued 38 years ago (Aug. 31, 1987)
Published 38 years ago (Aug. 31, 1987)
Published Print 38 years ago (Aug. 31, 1987)
Funders 0

None

@article{Allen_1987, title={Device quality growth and characterization of (110) GaAs grown by molecular beam epitaxy}, volume={51}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.98329}, DOI={10.1063/1.98329}, number={9}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Allen, L. T. P. and Weber, E. R. and Washburn, J. and Pao, Y. C.}, year={1987}, month=aug, pages={670–672} }