Abstract
A selective doping method of P atoms is proposed in lateral solid phase epitaxy (L-SPE) of amorphous Si films, in which L-SPE mainly proceeds along the P-doped regions and active devices are fabricated in the undoped regions. It was found that diffusion of P atoms into the undoped region was negligible during L-SPE growth at 600 °C for about 20 h. Usefulness of this method was demonstrated by fabricating metal-oxide-semiconductor field-effect transistors in the films, in which the P-doped regions were used as the source and drain regions and the undoped region was used as a channel between them.
References
7
Referenced
7
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 8:46 a.m.) |
Deposited | 1 year, 6 months ago (Feb. 5, 2024, 11:22 a.m.) |
Indexed | 1 year, 6 months ago (Feb. 29, 2024, 11:04 a.m.) |
Issued | 38 years, 9 months ago (Nov. 17, 1986) |
Published | 38 years, 9 months ago (Nov. 17, 1986) |
Published Print | 38 years, 9 months ago (Nov. 17, 1986) |
@article{Ishiwara_1986, title={Lateral solid phase epitaxy in selectively P-doped amorphous Si films}, volume={49}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.97325}, DOI={10.1063/1.97325}, number={20}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Ishiwara, Hiroshi and Tanaka, Makoto and Furukawa, Seijiro}, year={1986}, month=nov, pages={1363–1365} }