Abstract
Heterojunctions of n-type InAs0.95Sb0.05 grown by metalorganic chemical vapor deposition on n-type GaSb substrates were studied by capacitance-voltage and current-voltage measurements. The n-n heterojunctions are strongly rectifying and behave like metal-(n) GaSb Schottky diodes with a barrier height of 0.80±0.02 eV. These measurements establish that the band lineup in this system is of the broken gap variety. We measure the valence-band offset, Ev(GaSb)−Ev(InAs0.95Sb0.05), to be 0.67±0.04 eV.
References
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 8:46 a.m.) |
Deposited | 1 year, 7 months ago (Feb. 5, 2024, 11:01 a.m.) |
Indexed | 1 year, 2 months ago (July 2, 2024, 3:09 a.m.) |
Issued | 39 years, 1 month ago (July 7, 1986) |
Published | 39 years, 1 month ago (July 7, 1986) |
Published Print | 39 years, 1 month ago (July 7, 1986) |
@article{Srivastava_1986, title={Electrical characteristics of InAsSb/GaSb heterojunctions}, volume={49}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.97077}, DOI={10.1063/1.97077}, number={1}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Srivastava, A. K. and Zyskind, J. L. and Lum, R. M. and Dutt, B. V. and Klingert, J. K.}, year={1986}, month=jul, pages={41–43} }