Abstract
The recombination (electron capture) kinetics of the ionized DX center in AlxGa1−xAs have been measured as a function of temperature and silicon doping concentration. It is shown that for x≂0.35, the silicon concentration dependence of the recombination kinetics is dominated by effects of the electron distribution in the conduction band, and is insensitive to changes in the trap characteristics. In a model kinetic calculation consistent with the data the trap is found to capture through a level 0.202 eV from the bottom of the conduction band with a width of 0.045 eV, independent of DX center concentration.
References
9
Referenced
48
10.1103/PhysRevB.19.1015
/ Phys. Rev. B (1979){'key': '2024020515342608700_r2', 'first-page': '623', 'volume': '74', 'year': '1985', 'journal-title': 'Inst. Phys. Conf. Ser. No.'}
/ Inst. Phys. Conf. Ser. No. (1985)10.1088/0022-3719/17/34/004
/ J. Phys. C (1984)10.1143/JJAP.24.L143
/ Jpn. J. Appl. Phys. (1985)10.1103/PhysRevB.30.4481
/ Phys. Rev. B (1984)10.1557/PROC-46-403
/ Mater. Res. Soc. Symp. Proc. (1985){'key': '2024020515342608700_r7'}
{'key': '2024020515342608700_r8'}
10.1016/0038-1098(79)90995-5
/ Solid State Commun. (1979)
Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 8:46 a.m.) |
Deposited | 1 year, 6 months ago (Feb. 5, 2024, 10:53 a.m.) |
Indexed | 1 year, 6 months ago (Feb. 5, 2024, 11:44 a.m.) |
Issued | 39 years, 4 months ago (April 21, 1986) |
Published | 39 years, 4 months ago (April 21, 1986) |
Published Print | 39 years, 4 months ago (April 21, 1986) |
@article{Caswell_1986, title={Effect of the silicon doping concentration on the recombination kinetics of D X centers in Al0.35Ga0.65As}, volume={48}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.96608}, DOI={10.1063/1.96608}, number={16}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Caswell, N. S. and Mooney, P. M. and Wright, S. L. and Solomon, P. M.}, year={1986}, month=apr, pages={1093–1095} }