Abstract
Atmospheric pressure metalorganic vapor phase epitaxial growth and characterization of high quality GaN on sapphire (0001) substrates are reported. Using AlN buffer layers, GaN thin films with optically flat surfaces free from cracks are successfully grown. The narrowest x-ray rocking curve from the (0006) plane is 2.70′ and from the (202̄4) plane is 1.86′. Photoluminescence spectra show strong near band edge emission. The growth condition dependence of crystalline quality is also studied.
References
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Dates
Type | When |
---|---|
Created | 23 years ago (July 26, 2002, 8:46 a.m.) |
Deposited | 1 year, 6 months ago (Feb. 5, 2024, 10:42 a.m.) |
Indexed | 4 hours, 13 minutes ago (Aug. 23, 2025, 9:30 p.m.) |
Issued | 39 years, 6 months ago (Feb. 3, 1986) |
Published | 39 years, 6 months ago (Feb. 3, 1986) |
Published Print | 39 years, 6 months ago (Feb. 3, 1986) |
@article{Amano_1986, title={Metalorganic vapor phase epitaxial growth of a high quality GaN film using an AlN buffer layer}, volume={48}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.96549}, DOI={10.1063/1.96549}, number={5}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Amano, H. and Sawaki, N. and Akasaki, I. and Toyoda, Y.}, year={1986}, month=feb, pages={353–355} }