Abstract
A new silicon-on-insulator (SOI) structure has been achieved by utilizing silicon molecular beam epitaxial (Si-MBE) growth on porous silicon, silicon island patterning, and the subsequent laterally enhanced oxidation of the porous silicon. The surface of Si-MBE film grown on porous silicon at 770 °C without high-temperature preheating has a 7×7 superlattice structure when observed by a reflection high-energy electron diffraction (RHEED). Patterned Si-MBE film island, that is 7.0 μm wide and 0.35 μm thick, is successfully isolated by the laterally enhanced oxidation of porous silicon.
References
6
Referenced
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Dates
Type | When |
---|---|
Created | 22 years, 6 months ago (Feb. 13, 2003, 4:25 p.m.) |
Deposited | 1 year, 6 months ago (Feb. 5, 2024, 8:23 a.m.) |
Indexed | 5 months, 1 week ago (March 22, 2025, 4:38 a.m.) |
Issued | 43 years, 1 month ago (July 1, 1982) |
Published | 43 years, 1 month ago (July 1, 1982) |
Published Print | 43 years, 1 month ago (July 1, 1982) |
@article{Konaka_1982, title={A new silicon-on-insulator structure using a silicon molecular beam epitaxial growth on porous silicon}, volume={41}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.93298}, DOI={10.1063/1.93298}, number={1}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Konaka, Shinsuke and Tabe, Michiharu and Sakai, Tetsushi}, year={1982}, month=jul, pages={86–88} }