Abstract
A discrepancy between the photocurrent onset potential and the flatband potential derived from capacitance voltage measurements has been observed on p-type GaP semiconducting photoelectrodes. This discrepancy has been attributed previously by Butler and Ginley to a localized state acting as a recombination center. It is demonstrated that the experimental current-voltage characteristic can be fitted to a curve calculated from a theoretical model that takes into account the rate limitation due to the charge transfer across the semiconductor-electrolyte interface, and the recombinations in the space-charge layer. The very low electron and hole transfer currents across the interface are attributed to the weak overlap between semiconductor bands and redox ion state densities.
References
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Dates
Type | When |
---|---|
Created | 22 years, 6 months ago (Feb. 13, 2003, 4:19 p.m.) |
Deposited | 1 year, 6 months ago (Feb. 5, 2024, 8:09 a.m.) |
Indexed | 4 months, 3 weeks ago (April 10, 2025, 8:12 a.m.) |
Issued | 43 years, 6 months ago (March 1, 1982) |
Published | 43 years, 6 months ago (March 1, 1982) |
Published Print | 43 years, 6 months ago (March 1, 1982) |
@article{Horowitz_1982, title={Photocurrent onset potential and flatband potential of a p-type GaP semiconducting photoelectrode}, volume={40}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.93121}, DOI={10.1063/1.93121}, number={5}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Horowitz, G.}, year={1982}, month=mar, pages={409–411} }