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AIP Publishing
Applied Physics Letters (317)
Abstract

A discrepancy between the photocurrent onset potential and the flatband potential derived from capacitance voltage measurements has been observed on p-type GaP semiconducting photoelectrodes. This discrepancy has been attributed previously by Butler and Ginley to a localized state acting as a recombination center. It is demonstrated that the experimental current-voltage characteristic can be fitted to a curve calculated from a theoretical model that takes into account the rate limitation due to the charge transfer across the semiconductor-electrolyte interface, and the recombinations in the space-charge layer. The very low electron and hole transfer currents across the interface are attributed to the weak overlap between semiconductor bands and redox ion state densities.

Bibliography

Horowitz, G. (1982). Photocurrent onset potential and flatband potential of a p-type GaP semiconducting photoelectrode. Applied Physics Letters, 40(5), 409–411.

Authors 1
  1. G. Horowitz (first)
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Dates
Type When
Created 22 years, 6 months ago (Feb. 13, 2003, 4:19 p.m.)
Deposited 1 year, 6 months ago (Feb. 5, 2024, 8:09 a.m.)
Indexed 4 months, 3 weeks ago (April 10, 2025, 8:12 a.m.)
Issued 43 years, 6 months ago (March 1, 1982)
Published 43 years, 6 months ago (March 1, 1982)
Published Print 43 years, 6 months ago (March 1, 1982)
Funders 0

None

@article{Horowitz_1982, title={Photocurrent onset potential and flatband potential of a p-type GaP semiconducting photoelectrode}, volume={40}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.93121}, DOI={10.1063/1.93121}, number={5}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Horowitz, G.}, year={1982}, month=mar, pages={409–411} }