Abstract
An experimental technique for determining the minority carrier diffusion length in the base region of Si p-n junction diodes and solar cells is described. The procedure is to operate the device in the photoconductive mode and to measure its photoresponse in the wavelength region near the energy gap. The ratio of incident light intensity to photocurrent is a linear function of reciprocal absorption coefficient for each wavelength; the slope of the set of points directly yields the diffusion length. In addition, a nonlinear least-squares analysis is also used to determine the diffusion length.
References
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Dates
Type | When |
---|---|
Created | 22 years, 6 months ago (Feb. 13, 2003, 3:58 p.m.) |
Deposited | 1 year, 6 months ago (Feb. 5, 2024, 7:31 a.m.) |
Indexed | 3 months, 1 week ago (May 15, 2025, 7:27 a.m.) |
Issued | 45 years ago (Aug. 1, 1980) |
Published | 45 years ago (Aug. 1, 1980) |
Published Print | 45 years ago (Aug. 1, 1980) |
@article{Arora_1980, title={Diffusion length determination in p-n junction diodes and solar cells}, volume={37}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.91891}, DOI={10.1063/1.91891}, number={3}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Arora, N. D. and Chamberlain, S. G. and Roulston, D. J.}, year={1980}, month=aug, pages={325–327} }