Crossref journal-article
AIP Publishing
Applied Physics Letters (317)
Abstract

Light emission via inelastic tunneling (LEIT) has been observed from the metal-insulator-semiconductor tunnel-junction Al-Al2O3- Sn-doped indium oxide (ITO). The spectra exhibit the bias-voltage-dependent upper-frequency quantum cutoff relation. These devices were stable at room temperature for months at a time while biased to 3 V. The external quantum efficiency of this metal-insulator-semiconductor system is about 0.1 that of the metal-insulator-metal system Al-Al2O3-Ag. Enhancement of the light emission using silver particle resonators is also reported.

Bibliography

McCarthy, S. L., & Lambe, J. (1978). LEIT effect in metal-insulator-semiconductor tunnel junctions. Applied Physics Letters, 33(10), 858–860.

Authors 2
  1. S. L. McCarthy (first)
  2. John Lambe (additional)
References 18 Referenced 34
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Dates
Type When
Created 22 years, 6 months ago (Feb. 13, 2003, 3:32 p.m.)
Deposited 1 year, 6 months ago (Feb. 5, 2024, 5:55 a.m.)
Indexed 1 year, 6 months ago (Feb. 5, 2024, 9:28 a.m.)
Issued 46 years, 9 months ago (Nov. 15, 1978)
Published 46 years, 9 months ago (Nov. 15, 1978)
Published Print 46 years, 9 months ago (Nov. 15, 1978)
Funders 0

None

@article{McCarthy_1978, title={LEIT effect in metal-insulator-semiconductor tunnel junctions}, volume={33}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.90214}, DOI={10.1063/1.90214}, number={10}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={McCarthy, S. L. and Lambe, John}, year={1978}, month=nov, pages={858–860} }