DOI: 10.1063/1.4981937. Force-gradient sensitive Kelvin probe force microscopy by dissipative electrostatic force modulation

Force-gradient sensitive Kelvin probe force microscopy by dissipative electrostatic force modulation

10.1063/1.4981937

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

We report a Kelvin probe force microscopy (KPFM) implementation using the dissipation signal of a frequency modulation atomic force microscopy that is capable of detecting the gradient of electrostatic force rather than electrostatic force. It features a simple implementation and faster scanning as it requires no low frequency modulation. We show that applying a coherent ac voltage with two times the cantilever oscillation frequency induces the dissipation signal proportional to the electrostatic force gradient which depends on the effective dc bias voltage including the contact potential difference. We demonstrate the KPFM images of a MoS2 flake taken with the present method are in quantitative agreement with those taken with the frequency modulated Kelvin probe force microscopy technique.

Bibliography

Miyahara, Y., & Grutter, P. (2017). Force-gradient sensitive Kelvin probe force microscopy by dissipative electrostatic force modulation. Applied Physics Letters, 110(16).

Authors 2

Yoichi Miyahara (first)
Peter Grutter (additional)

References 18 Referenced 16

10.1103/PhysRevApplied.4.054011 / Phys. Rev. Appl. (2015)
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10.1016/S0169-4332(99)00530-9 / Appl. Surf. Sci. (2000)
10.1088/0953-8984/12/6/304 / J. Phys.: Condens. Matter (2000)
10.1063/1.4712286 / Rev. Sci. Instrum. (2012)
10.1063/1.347347 / J. Appl. Phys. (1991)
10.1103/PhysRevB.64.075402 / Phys. Rev. B (2001)
10.1103/PhysRevLett.93.236102 / Phys. Rev. Lett. (2004)
10.1088/0957-4484/16/3/018 / Nanotechnology (2005)
10.1063/1.4723697 / Appl. Phys. Lett. (2012)
10.1063/1.2432281 / Appl. Phys. Lett. (2007)
10.1063/1.1805291 / Rev. Sci. Instrum. (2004)
10.1116/1.3374719 / J. Vac. Sci. Technol., B: Nanotechnol. Microelectron. (2010)
10.1116/1.588494 / J. Vac. Sci. Technol., B: Nanotechnol. Microelectron. (1996)
10.1063/1.368181 / J. Appl. Phys. (1998)
10.1016/S0169-4332(02)01484-8 / Appl. Surf. Sci. (2003)
10.1103/PhysRevB.71.125424 / Phys. Rev. B (2005)
10.1016/j.ultramic.2009.10.016 / Ultramicroscopy (2010)

Dates

Type	When
Created	8 years, 4 months ago (April 20, 2017, 10:27 a.m.)
Deposited	2 years, 1 month ago (June 27, 2023, 10:45 p.m.)
Indexed	3 weeks, 4 days ago (July 30, 2025, 7:09 a.m.)
Issued	8 years, 4 months ago (April 17, 2017)
Published	8 years, 4 months ago (April 17, 2017)
Published Online	8 years, 4 months ago (April 20, 2017)
Published Print	8 years, 4 months ago (April 17, 2017)

Funders 2

Fonds de Recherche du Québec - Nature et Technologies 10.13039/501100003151 Fonds de recherche du Québec – Nature et technologies
Region: Americas
gov (Local government)
Labels1
1. FRQNT
Natural Sciences and Engineering Research Council of Canada 10.13039/501100000038
Region: Americas
gov (National government)
Labels3
1. Conseil de Recherches en Sciences Naturelles et en Génie du Canada
2. NSERC
3. CRSNG

BibTeX

@article{Miyahara_2017, title={Force-gradient sensitive Kelvin probe force microscopy by dissipative electrostatic force modulation}, volume={110}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.4981937}, DOI={10.1063/1.4981937}, number={16}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Miyahara, Yoichi and Grutter, Peter}, year={2017}, month=apr }

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