DOI: 10.1063/1.4933289. Pump-probe Kelvin-probe force microscopy: Principle of operation and resolution limits

Pump-probe Kelvin-probe force microscopy: Principle of operation and resolution limits

10.1063/1.4933289

Crossref journal-article

AIP Publishing

Journal of Applied Physics (317)

Abstract

Knowledge on surface potential dynamics is crucial for understanding the performance of modern-type nanoscale devices. We describe an electrical pump-probe approach in Kelvin-probe force microscopy that enables a quantitative measurement of dynamic surface potentials at nanosecond-time and nanometer-length scales. Also, we investigate the performance of pump-probe Kelvin-probe force microscopy with respect to the relevant experimental parameters. We exemplify a measurement on an organic field effect transistor that verifies the undisturbed functionality of our pump-probe approach in terms of simultaneous and quantitative mapping of topographic and electronic information at a high lateral and temporal resolution.

Bibliography

Murawski, J., Graupner, T., Milde, P., Raupach, R., Zerweck-Trogisch, U., & Eng, L. M. (2015). Pump-probe Kelvin-probe force microscopy: Principle of operation and resolution limits. Journal of Applied Physics, 118(15).

Authors 6

J. Murawski (first)
T. Graupner (additional)
P. Milde (additional)
R. Raupach (additional)
U. Zerweck-Trogisch (additional)
L. M. Eng (additional)

References 18 Referenced 44

10.1116/1.585423 / J. Vac. Sci. Technol., B (1991)
10.1063/1.105227 / Appl. Phys. Lett. (1991)
10.1103/PhysRevB.71.125424 / Phys. Rev. B (2005)
10.1063/1.121577 / Appl. Phys. Lett. (1998)
10.1016/j.surfrep.2010.10.001 / Surf. Sci. Rep. (2011)
10.1126/science.262.5136.1029 / Science (1993)
10.1063/1.120798 / Appl. Phys. Lett. (1998)
10.1049/el:19930969 / Electron. Lett. (1993)
10.1116/1.587856 / J. Vac. Sci. Technol., B (1995)
10.1038/nmat1712 / Nat. Mater. (2006)
10.1002/adma.201300004 / Adv. Mater. (2013)
10.1021/nn4017873 / ACS Nano (2013)
10.1002/pssa.201431336 / Phys. Status Solidi (2014)
10.1103/PhysRevLett.91.266101 / Phys. Rev. Lett. (2003)
10.1016/S0169-4332(02)01484-8 / Appl. Surf. Sci. (2003)
{'key': '2023062400445619600_c16'}
10.1007/s003390051132 / Appl. Phys. A (1998)
{'issue': '4', 'key': '2023062400445619600_c18', 'first-page': '620', 'volume': '93', 'year': '1946', 'journal-title': 'J. Inst. Electr. Eng., Part IIIA: Radiolocation'} / J. Inst. Electr. Eng., Part IIIA: Radiolocation (1946)

Dates

Type	When
Created	9 years, 10 months ago (Oct. 15, 2015, 1:57 p.m.)
Deposited	2 years, 2 months ago (June 24, 2023, 9:15 a.m.)
Indexed	6 days, 4 hours ago (Aug. 23, 2025, 9:33 p.m.)
Issued	9 years, 10 months ago (Oct. 15, 2015)
Published	9 years, 10 months ago (Oct. 15, 2015)
Published Online	9 years, 10 months ago (Oct. 15, 2015)
Published Print	9 years, 10 months ago (Oct. 21, 2015)

Funders 1

Deutsche Forschungsgemeinschaft 10.13039/501100001659
Region: Europe
gov (National government)
Labels3
1. German Research Association
2. German Research Foundation
3. DFG
Awards3
1. Center for Advancing Electronics Dresden
2. ZE 891/1-1
3. RTG 1401/2

BibTeX

@article{Murawski_2015, title={Pump-probe Kelvin-probe force microscopy: Principle of operation and resolution limits}, volume={118}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.4933289}, DOI={10.1063/1.4933289}, number={15}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Murawski, J. and Graupner, T. and Milde, P. and Raupach, R. and Zerweck-Trogisch, U. and Eng, L. M.}, year={2015}, month=oct }

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