DOI: 10.1063/1.4913910. Band excitation Kelvin probe force microscopy utilizing photothermal excitation

Band excitation Kelvin probe force microscopy utilizing photothermal excitation

10.1063/1.4913910

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

A multifrequency open loop Kelvin probe force microscopy (KPFM) approach utilizing photothermal as opposed to electrical excitation is developed. Photothermal band excitation (PthBE)-KPFM is implemented here in a grid mode on a model test sample comprising a metal-insulator junction with local charge-patterned regions. Unlike the previously described open loop BE-KPFM, which relies on capacitive actuation of the cantilever, photothermal actuation is shown to be highly sensitive to the electrostatic force gradient even at biases close to the contact potential difference (CPD). PthBE-KPFM is further shown to provide a more localized measurement of true CPD in comparison to the gold standard ambient KPFM approach, amplitude modulated KPFM. Finally, PthBE-KPFM data contain information relating to local dielectric properties and electronic dissipation between tip and sample unattainable using conventional single frequency KPFM approaches.

Bibliography

Collins, L., Jesse, S., Balke, N., Rodriguez, B. J., Kalinin, S., & Li, Q. (2015). Band excitation Kelvin probe force microscopy utilizing photothermal excitation. Applied Physics Letters, 106(10).

Authors 6

Liam Collins (first)
Stephen Jesse (additional)
Nina Balke (additional)
Brian J. Rodriguez (additional)
Sergei Kalinin (additional)
Qian Li (additional)

References 40 Referenced 18

10.1063/1.105227 / Appl. Phys. Lett. (1991)
10.1149/1.1809590 / J. Electrochem. Soc. (2004)
10.1149/1.1359199 / J. Electrochem. Soc. (2001)
10.1088/1742-6596/371/1/012030 / J. Phys.: Conf. Ser. (2012)
10.1103/PhysRevB.83.235434 / Phys. Rev. B (2011)
10.1021/nn4017873 / ACS Nano (2013)
10.1021/nl400780d / Nano Lett. (2013)
10.1116/1.589136 / J. Vac. Sci. Technol., B: Microelectron. Nanometer Struct. (1996)
10.1088/0957-4484/12/4/321 / Nanotechnology (2001)
10.1103/PhysRevB.62.10419 / Phys. Rev. B (2000)
10.1103/PhysRevB.63.125411 / Phys. Rev. B (2001)
10.1002/(SICI)1096-9918(199905/06)27:5/6<368::AID-SIA530>3.0.CO;2-W / Surf. Interface Anal. (1999)
10.1021/nl048176c / Nano Lett. (2005)
10.1021/nl9012979 / Nano Lett. (2009)
10.1038/nnano.2007.293 / Nat. Nanotechnol. (2007)
10.1103/PhysRevB.71.125424 / Phys. Rev. B (2005)
10.1063/1.4723697 / Appl. Phys. Lett. (2012)
10.1063/1.4870074 / Appl. Phys. Lett. (2014)
10.1038/ncomms4871 / Nat. Commun. (2014)
10.1038/nmat3369 / Nat. Mater. (2012)
10.1021/nl803851u / Nano Lett. (2009)
10.1063/1.3427362 / Appl. Phys. Lett. (2010)
10.1088/0957-4484/20/39/395702 / Nanotechnology (2009)
10.1063/1.106088 / Appl. Phys. Lett. (1991)
10.1088/0957-4484/24/13/135706 / Nanotechnology (2013)
{'volume-title': 'Kelvin Probe Force Microscopy', 'year': '2012', 'key': '2023062801135627700_c26'} / Kelvin Probe Force Microscopy (2012)
10.1088/0957-4484/24/47/475702 / Nanotechnology (2013)
10.1063/1.3516046 / Rev. Sci. Instrum. (2011)
10.1088/0957-4484/23/12/125704 / Nanotechnology (2012)
10.1063/1.2195104 / Rev. Sci. Instrum. (2006)
10.1021/jp806657k / J. Phys. Chem. C (2008)
10.1016/S0169-4332(01)00953-9 / Appl. Surf. Sci. (2002)
{'first-page': '1', 'volume-title': 'Applications of Ferroelectrics Held Jointly with 2012 European Conference on the Applications of Polar Dielectrics and 2012 International Symposium on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials (ISAF/ECAPD/PFM)', 'year': '2012', 'key': '2023062801135627700_c33'} / Applications of Ferroelectrics Held Jointly with 2012 European Conference on the Applications of Polar Dielectrics and 2012 International Symposium on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials (ISAF/ECAPD/PFM) (2012)
10.1088/0957-4484/17/15/019 / Nanotechnology (2006)
10.1063/1.3684274 / Appl. Phys. Lett. (2012)
10.1063/1.368181 / J. Appl. Phys. (1998)
10.1063/1.121577 / Appl. Phys. Lett. (1998)
10.1380/ejssnt.2006.192 / e-J. Surf. Sci. Nanotechnol. (2006)
10.1088/0957-4484/18/43/435503 / Nanotechnology (2007)
10.1021/nn506753u / ACS Nano (2015)

Dates

Type	When
Created	10 years, 5 months ago (March 13, 2015, 1 p.m.)
Deposited	2 years, 2 months ago (June 27, 2023, 9:14 p.m.)
Indexed	1 month ago (July 30, 2025, 7:03 a.m.)
Issued	10 years, 5 months ago (March 9, 2015)
Published	10 years, 5 months ago (March 9, 2015)
Published Online	10 years, 5 months ago (March 13, 2015)
Published Print	10 years, 5 months ago (March 9, 2015)

Funders 0

None

BibTeX

@article{Collins_2015, title={Band excitation Kelvin probe force microscopy utilizing photothermal excitation}, volume={106}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.4913910}, DOI={10.1063/1.4913910}, number={10}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Collins, Liam and Jesse, Stephen and Balke, Nina and Rodriguez, Brian J. and Kalinin, Sergei and Li, Qian}, year={2015}, month=mar }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2025,
        7,
        30
      ]
    ],
    "date-time": "2025-07-30T11:03:18Z",
    "timestamp": 1753873398051,
    "version": "3.41.2"
  },
  "reference-count": 40,
  "publisher": "AIP Publishing",
  "issue": "10",
  "content-domain": {
    "domain": [
      "pubs.aip.org"
    ],
    "crossmark-restriction": true
  },
  "published-print": {
    "date-parts": [
      [
        2015,
        3,
        9
      ]
    ]
  },
  "abstract": "<jats:p>A multifrequency open loop Kelvin probe force microscopy (KPFM) approach utilizing photothermal as opposed to electrical excitation is developed. Photothermal band excitation (PthBE)-KPFM is implemented here in a grid mode on a model test sample comprising a metal-insulator junction with local charge-patterned regions. Unlike the previously described open loop BE-KPFM, which relies on capacitive actuation of the cantilever, photothermal actuation is shown to be highly sensitive to the electrostatic force gradient even at biases close to the contact potential difference (CPD). PthBE-KPFM is further shown to provide a more localized measurement of true CPD in comparison to the gold standard ambient KPFM approach, amplitude modulated KPFM. Finally, PthBE-KPFM data contain information relating to local dielectric properties and electronic dissipation between tip and sample unattainable using conventional single frequency KPFM approaches.</jats:p>",
  "DOI": "10.1063/1.4913910",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2015,
        3,
        13
      ]
    ],
    "date-time": "2015-03-13T17:00:27Z",
    "timestamp": 1426266027000
  },
  "update-policy": "https://doi.org/10.1063/aip-crossmark-policy-page",
  "source": "Crossref",
  "is-referenced-by-count": 18,
  "title": "Band excitation Kelvin probe force microscopy utilizing photothermal excitation",
  "prefix": "10.1063",
  "volume": "106",
  "author": [
    {
      "given": "Liam",
      "family": "Collins",
      "sequence": "first",
      "affiliation": [
        {
          "name": "University College Dublin 1 School of Physics, , Belfield, Dublin 4, Ireland"
        },
        {
          "name": "University College Dublin 2 Conway Institute of Biomolecular and Biomedical Research, , Belfield, Dublin 4, Ireland"
        }
      ]
    },
    {
      "given": "Stephen",
      "family": "Jesse",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "Oak Ridge National Laboratory 3 Center for Nanophase Materials Sciences, , Oak Ridge, Tennessee 37831, USA"
        }
      ]
    },
    {
      "given": "Nina",
      "family": "Balke",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "Oak Ridge National Laboratory 3 Center for Nanophase Materials Sciences, , Oak Ridge, Tennessee 37831, USA"
        }
      ]
    },
    {
      "given": "Brian J.",
      "family": "Rodriguez",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "University College Dublin 1 School of Physics, , Belfield, Dublin 4, Ireland"
        },
        {
          "name": "University College Dublin 2 Conway Institute of Biomolecular and Biomedical Research, , Belfield, Dublin 4, Ireland"
        }
      ]
    },
    {
      "ORCID": "https://orcid.org/0000-0001-5354-6152",
      "authenticated-orcid": false,
      "given": "Sergei",
      "family": "Kalinin",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "Oak Ridge National Laboratory 3 Center for Nanophase Materials Sciences, , Oak Ridge, Tennessee 37831, USA"
        }
      ]
    },
    {
      "given": "Qian",
      "family": "Li",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "Oak Ridge National Laboratory 3 Center for Nanophase Materials Sciences, , Oak Ridge, Tennessee 37831, USA"
        }
      ]
    }
  ],
  "member": "317",
  "published-online": {
    "date-parts": [
      [
        2015,
        3,
        13
      ]
    ]
  },
  "reference": [
    {
      "issue": "25",
      "key": "2023062801135627700_c1",
      "doi-asserted-by": "publisher",
      "first-page": "2921",
      "DOI": "10.1063/1.105227",
      "volume": "58",
      "year": "1991",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "issue": "12",
      "key": "2023062801135627700_c2",
      "doi-asserted-by": "publisher",
      "first-page": "B621",
      "DOI": "10.1149/1.1809590",
      "volume": "151",
      "year": "2004",
      "journal-title": "J. Electrochem. Soc."
    },
    {
      "issue": "5",
      "key": "2023062801135627700_c3",
      "doi-asserted-by": "publisher",
      "first-page": "B163",
      "DOI": "10.1149/1.1359199",
      "volume": "148",
      "year": "2001",
      "journal-title": "J. Electrochem. Soc."
    },
    {
      "key": "2023062801135627700_c4",
      "doi-asserted-by": "publisher",
      "first-page": "012030",
      "DOI": "10.1088/1742-6596/371/1/012030",
      "volume": "371",
      "year": "2012",
      "journal-title": "J. Phys.: Conf. Ser."
    },
    {
      "issue": "23",
      "key": "2023062801135627700_c5",
      "doi-asserted-by": "publisher",
      "first-page": "235434",
      "DOI": "10.1103/PhysRevB.83.235434",
      "volume": "83",
      "year": "2011",
      "journal-title": "Phys. Rev. B"
    },
    {
      "issue": "8",
      "key": "2023062801135627700_c6",
      "doi-asserted-by": "publisher",
      "first-page": "6806",
      "DOI": "10.1021/nn4017873",
      "volume": "7",
      "year": "2013",
      "journal-title": "ACS Nano"
    },
    {
      "issue": "8",
      "key": "2023062801135627700_c7",
      "doi-asserted-by": "publisher",
      "first-page": "3455",
      "DOI": "10.1021/nl400780d",
      "volume": "13",
      "year": "2013",
      "journal-title": "Nano Lett."
    },
    {
      "issue": "2",
      "key": "2023062801135627700_c8",
      "doi-asserted-by": "publisher",
      "first-page": "1547",
      "DOI": "10.1116/1.589136",
      "volume": "14",
      "year": "1996",
      "journal-title": "J. Vac. Sci. Technol., B: Microelectron. Nanometer Struct."
    },
    {
      "issue": "4",
      "key": "2023062801135627700_c9",
      "doi-asserted-by": "publisher",
      "first-page": "485",
      "DOI": "10.1088/0957-4484/12/4/321",
      "volume": "12",
      "year": "2001",
      "journal-title": "Nanotechnology"
    },
    {
      "issue": "15",
      "key": "2023062801135627700_c10",
      "doi-asserted-by": "publisher",
      "first-page": "10419",
      "DOI": "10.1103/PhysRevB.62.10419",
      "volume": "62",
      "year": "2000",
      "journal-title": "Phys. Rev. B"
    },
    {
      "issue": "12",
      "key": "2023062801135627700_c11",
      "doi-asserted-by": "publisher",
      "first-page": "125411",
      "DOI": "10.1103/PhysRevB.63.125411",
      "volume": "63",
      "year": "2001",
      "journal-title": "Phys. Rev. B"
    },
    {
      "issue": "5\u20136",
      "key": "2023062801135627700_c12",
      "doi-asserted-by": "publisher",
      "first-page": "368",
      "DOI": "10.1002/(SICI)1096-9918(199905/06)27:5/6&lt;368::AID-SIA530&gt;3.0.CO;2-W",
      "volume": "27",
      "year": "1999",
      "journal-title": "Surf. Interface Anal."
    },
    {
      "issue": "2",
      "key": "2023062801135627700_c13",
      "doi-asserted-by": "publisher",
      "first-page": "269",
      "DOI": "10.1021/nl048176c",
      "volume": "5",
      "year": "2005",
      "journal-title": "Nano Lett."
    },
    {
      "issue": "7",
      "key": "2023062801135627700_c14",
      "doi-asserted-by": "publisher",
      "first-page": "2769",
      "DOI": "10.1021/nl9012979",
      "volume": "9",
      "year": "2009",
      "journal-title": "Nano Lett."
    },
    {
      "issue": "10",
      "key": "2023062801135627700_c15",
      "doi-asserted-by": "publisher",
      "first-page": "653",
      "DOI": "10.1038/nnano.2007.293",
      "volume": "2",
      "year": "2007",
      "journal-title": "Nat. Nanotechnol."
    },
    {
      "issue": "12",
      "key": "2023062801135627700_c16",
      "doi-asserted-by": "publisher",
      "first-page": "125424",
      "DOI": "10.1103/PhysRevB.71.125424",
      "volume": "71",
      "year": "2005",
      "journal-title": "Phys. Rev. B"
    },
    {
      "issue": "22",
      "key": "2023062801135627700_c17",
      "doi-asserted-by": "publisher",
      "first-page": "223104",
      "DOI": "10.1063/1.4723697",
      "volume": "100",
      "year": "2012",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "issue": "13",
      "key": "2023062801135627700_c18",
      "doi-asserted-by": "publisher",
      "first-page": "133103",
      "DOI": "10.1063/1.4870074",
      "volume": "104",
      "year": "2014",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "2023062801135627700_c19",
      "doi-asserted-by": "publisher",
      "first-page": "3871",
      "DOI": "10.1038/ncomms4871",
      "volume": "5",
      "year": "2014",
      "journal-title": "Nat. Commun."
    },
    {
      "issue": "9",
      "key": "2023062801135627700_c20",
      "doi-asserted-by": "publisher",
      "first-page": "808",
      "DOI": "10.1038/nmat3369",
      "volume": "11",
      "year": "2012",
      "journal-title": "Nat. Mater."
    },
    {
      "issue": "4",
      "key": "2023062801135627700_c21",
      "doi-asserted-by": "publisher",
      "first-page": "1604",
      "DOI": "10.1021/nl803851u",
      "volume": "9",
      "year": "2009",
      "journal-title": "Nano Lett."
    },
    {
      "issue": "18",
      "key": "2023062801135627700_c22",
      "doi-asserted-by": "publisher",
      "first-page": "183107",
      "DOI": "10.1063/1.3427362",
      "volume": "96",
      "year": "2010",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "issue": "39",
      "key": "2023062801135627700_c23",
      "doi-asserted-by": "publisher",
      "first-page": "395702",
      "DOI": "10.1088/0957-4484/20/39/395702",
      "volume": "20",
      "year": "2009",
      "journal-title": "Nanotechnology"
    },
    {
      "issue": "17",
      "key": "2023062801135627700_c24",
      "doi-asserted-by": "publisher",
      "first-page": "2171",
      "DOI": "10.1063/1.106088",
      "volume": "59",
      "year": "1991",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "issue": "13",
      "key": "2023062801135627700_c25",
      "doi-asserted-by": "publisher",
      "first-page": "135706",
      "DOI": "10.1088/0957-4484/24/13/135706",
      "volume": "24",
      "year": "2013",
      "journal-title": "Nanotechnology"
    },
    {
      "volume-title": "Kelvin Probe Force Microscopy",
      "year": "2012",
      "key": "2023062801135627700_c26"
    },
    {
      "issue": "47",
      "key": "2023062801135627700_c27",
      "doi-asserted-by": "publisher",
      "first-page": "475702",
      "DOI": "10.1088/0957-4484/24/47/475702",
      "volume": "24",
      "year": "2013",
      "journal-title": "Nanotechnology"
    },
    {
      "issue": "3",
      "key": "2023062801135627700_c28",
      "doi-asserted-by": "publisher",
      "first-page": "036101",
      "DOI": "10.1063/1.3516046",
      "volume": "82",
      "year": "2011",
      "journal-title": "Rev. Sci. Instrum."
    },
    {
      "key": "2023062801135627700_c29",
      "doi-asserted-by": "publisher",
      "first-page": "125704",
      "DOI": "10.1088/0957-4484/23/12/125704",
      "volume": "23",
      "year": "2012",
      "journal-title": "Nanotechnology"
    },
    {
      "key": "2023062801135627700_c30",
      "doi-asserted-by": "publisher",
      "first-page": "043711",
      "DOI": "10.1063/1.2195104",
      "volume": "77",
      "year": "2006",
      "journal-title": "Rev. Sci. Instrum."
    },
    {
      "issue": "44",
      "key": "2023062801135627700_c31",
      "doi-asserted-by": "publisher",
      "first-page": "17368",
      "DOI": "10.1021/jp806657k",
      "volume": "112",
      "year": "2008",
      "journal-title": "J. Phys. Chem. C"
    },
    {
      "issue": "3\u20134",
      "key": "2023062801135627700_c32",
      "doi-asserted-by": "publisher",
      "first-page": "381",
      "DOI": "10.1016/S0169-4332(01)00953-9",
      "volume": "188",
      "year": "2002",
      "journal-title": "Appl. Surf. Sci."
    },
    {
      "first-page": "1",
      "volume-title": "Applications of Ferroelectrics Held Jointly with 2012 European Conference on the Applications of Polar Dielectrics and 2012 International Symposium on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials (ISAF/ECAPD/PFM)",
      "year": "2012",
      "key": "2023062801135627700_c33"
    },
    {
      "issue": "15",
      "key": "2023062801135627700_c34",
      "doi-asserted-by": "publisher",
      "first-page": "3728",
      "DOI": "10.1088/0957-4484/17/15/019",
      "volume": "17",
      "year": "2006",
      "journal-title": "Nanotechnology"
    },
    {
      "issue": "6",
      "key": "2023062801135627700_c35",
      "doi-asserted-by": "publisher",
      "first-page": "063118",
      "DOI": "10.1063/1.3684274",
      "volume": "100",
      "year": "2012",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "issue": "3",
      "key": "2023062801135627700_c36",
      "doi-asserted-by": "publisher",
      "first-page": "1168",
      "DOI": "10.1063/1.368181",
      "volume": "84",
      "year": "1998",
      "journal-title": "J. Appl. Phys."
    },
    {
      "issue": "24",
      "key": "2023062801135627700_c37",
      "doi-asserted-by": "publisher",
      "first-page": "3154",
      "DOI": "10.1063/1.121577",
      "volume": "72",
      "year": "1998",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "issue": "0",
      "key": "2023062801135627700_c38",
      "doi-asserted-by": "publisher",
      "first-page": "192",
      "DOI": "10.1380/ejssnt.2006.192",
      "volume": "4",
      "year": "2006",
      "journal-title": "e-J. Surf. Sci. Nanotechnol."
    },
    {
      "issue": "43",
      "key": "2023062801135627700_c39",
      "doi-asserted-by": "publisher",
      "first-page": "435503",
      "DOI": "10.1088/0957-4484/18/43/435503",
      "volume": "18",
      "year": "2007",
      "journal-title": "Nanotechnology"
    },
    {
      "issue": "2",
      "key": "2023062801135627700_c40",
      "doi-asserted-by": "publisher",
      "first-page": "1848",
      "DOI": "10.1021/nn506753u",
      "volume": "9",
      "year": "2015",
      "journal-title": "ACS Nano"
    }
  ],
  "container-title": "Applied Physics Letters",
  "original-title": [],
  "language": "en",
  "link": [
    {
      "URL": "https://pubs.aip.org/aip/apl/article-pdf/doi/10.1063/1.4913910/14322404/104102_1_online.pdf",
      "content-type": "application/pdf",
      "content-version": "vor",
      "intended-application": "syndication"
    },
    {
      "URL": "https://pubs.aip.org/aip/apl/article-pdf/doi/10.1063/1.4913910/14322404/104102_1_online.pdf",
      "content-type": "unspecified",
      "content-version": "vor",
      "intended-application": "similarity-checking"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2023,
        6,
        28
      ]
    ],
    "date-time": "2023-06-28T01:14:08Z",
    "timestamp": 1687914848000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://pubs.aip.org/apl/article/106/10/104102/236345/Band-excitation-Kelvin-probe-force-microscopy"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        2015,
        3,
        9
      ]
    ]
  },
  "references-count": 40,
  "journal-issue": {
    "issue": "10",
    "published-print": {
      "date-parts": [
        [
          2015,
          3,
          9
        ]
      ]
    }
  },
  "URL": "http://dx.doi.org/10.1063/1.4913910",
  "relation": {},
  "ISSN": [
    "0003-6951",
    "1077-3118"
  ],
  "subject": [],
  "published-other": {
    "date-parts": [
      [
        2015,
        3,
        9
      ]
    ]
  },
  "published": {
    "date-parts": [
      [
        2015,
        3,
        9
      ]
    ]
  },
  "article-number": "104102"
}