Abstract
Spectroscopic ellipsometry was used to characterize the complex refractive index of chemical-vapor-deposited monolayer transition metal dichalcogenides (TMDs). The extraordinary large value of the refractive index in the visible frequency range is obtained. The absorption response shows a strong correlation between the magnitude of the exciton binding energy and band gap energy. Together with the observed giant spin-orbit splitting, these findings advance the fundamental understanding of their novel electronic structures and the development of monolayer TMDs-based optoelectronic and spintronic devices.
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Dates
Type | When |
---|---|
Created | 10 years, 9 months ago (Nov. 18, 2014, 8:30 p.m.) |
Deposited | 2 years, 2 months ago (June 17, 2023, 9:28 p.m.) |
Indexed | 4 days, 20 hours ago (Aug. 30, 2025, 1:12 p.m.) |
Issued | 10 years, 9 months ago (Nov. 17, 2014) |
Published | 10 years, 9 months ago (Nov. 17, 2014) |
Published Online | 10 years, 9 months ago (Nov. 18, 2014) |
Published Print | 10 years, 9 months ago (Nov. 17, 2014) |
@article{Liu_2014, title={Optical properties of monolayer transition metal dichalcogenides probed by spectroscopic ellipsometry}, volume={105}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.4901836}, DOI={10.1063/1.4901836}, number={20}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Liu, Hsiang-Lin and Shen, Chih-Chiang and Su, Sheng-Han and Hsu, Chang-Lung and Li, Ming-Yang and Li, Lain-Jong}, year={2014}, month=nov }