DOI: 10.1063/1.4896881. Practical aspects of Kelvin-probe force microscopy at solid/liquid interfaces in various liquid media

Practical aspects of Kelvin-probe force microscopy at solid/liquid interfaces in various liquid media

10.1063/1.4896881

Crossref journal-article

AIP Publishing

Journal of Applied Physics (317)

Abstract

The distributions of surface charges or surface potentials on biological molecules and electrodes are directly related to various biological functions and ionic adsorptions, respectively. Electrostatic force microscopy and Kelvin-probe force microscopy (KFM) are useful scanning probe techniques that can map local surface charges and potentials. Here, we report the measurement and analysis of the electrostatic and capacitive forces on the cantilever tip induced by application of an alternating voltage in order to discuss the feasibility of measuring the surface charge or potential distribution at solid/liquid interfaces in various liquid media. The results presented here suggest that a nanometer-scale surface charge or potential measurement by the conventional voltage modulation techniques is only possible under ambient conditions and in a non-polar medium and is difficult in an aqueous solution. Practically, the electrostatic force versus dc voltage curve in water does not include the minimum, which is used for the surface potential compensation. This is because the cantilever oscillation induced by the electrostatic force acting on the tip apex is overwhelmed by the parasitic oscillation induced by the electrostatic force acting on the entire cantilever as well as the surface stress effect. We both experimentally and theoretically discuss the factors which cause difficulties in application of the voltage modulation techniques in the aqueous solutions and present some criteria for local surface charge and potential measurements by circumventing these problems.

Bibliography

Umeda, K., Kobayashi, K., Oyabu, N., Hirata, Y., Matsushige, K., & Yamada, H. (2014). Practical aspects of Kelvin-probe force microscopy at solid/liquid interfaces in various liquid media. Journal of Applied Physics, 116(13).

Authors 6

Ken-ichi Umeda (first)
Kei Kobayashi (additional)
Noriaki Oyabu (additional)
Yoshiki Hirata (additional)
Kazumi Matsushige (additional)
Hirofumi Yamada (additional)

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Dates

Type	When
Created	10 years, 10 months ago (Oct. 3, 2014, 8:30 p.m.)
Deposited	2 years ago (July 29, 2023, 1:13 a.m.)
Indexed	1 week, 4 days ago (Aug. 12, 2025, 5:42 p.m.)
Issued	10 years, 10 months ago (Oct. 3, 2014)
Published	10 years, 10 months ago (Oct. 3, 2014)
Published Online	10 years, 10 months ago (Oct. 3, 2014)
Published Print	10 years, 10 months ago (Oct. 7, 2014)

Funders 1

Japan Science and Technology Agency (JST) 10.13039/501100002241 Japan Science and Technology Agency
Region: Asia
gov (National government)
Labels7
1. SCIENCE AND TECHNOLOGY AGENCY OF JAPAN
2. 国立研究開発法人科学技術振興機構
3. 国立研究開発法人科学技術振興機構 japan science and technology agency
4. Japan Science and Technology Agency (JST)
5. かがくぎじゅつしんこうきこう
6. 科学技術振興機構
7. JST

BibTeX

@article{Umeda_2014, title={Practical aspects of Kelvin-probe force microscopy at solid/liquid interfaces in various liquid media}, volume={116}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.4896881}, DOI={10.1063/1.4896881}, number={13}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Umeda, Ken-ichi and Kobayashi, Kei and Oyabu, Noriaki and Hirata, Yoshiki and Matsushige, Kazumi and Yamada, Hirofumi}, year={2014}, month=oct }

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