DOI: 10.1063/1.4822438. Evidence for multifilamentary valence changes in resistive switching SrTiO3 devices detected by transmission X-ray microscopy

Evidence for multifilamentary valence changes in resistive switching SrTiO3 devices detected by transmission X-ray microscopy

10.1063/1.4822438

Crossref journal-article

AIP Publishing

APL Materials (317)

Abstract

Transmission X-ray microscopy is employed to detect nanoscale valence changes in resistive switching SrTiO3 thin film devices. By recording Ti L-edge spectra of samples in different resistive states, we could show that some spots with slightly distorted structure and a small reduction to Ti3+ are already present in the virgin films. In the ON-state, these spots are further reduced to Ti3+ to different degrees while the remaining film persists in the Ti4+ configuration. These observations are consistent with a self-accelerating reduction within pre-reduced extended growth defects.

Bibliography

Koehl, A., Wasmund, H., Herpers, A., Guttmann, P., Werner, S., Henzler, K., Du, H., Mayer, J., Waser, R., & Dittmann, R. (2013). Evidence for multifilamentary valence changes in resistive switching SrTiO3 devices detected by transmission X-ray microscopy. APL Materials, 1(4).

Authors 10

A. Koehl (first)
H. Wasmund (additional)
A. Herpers (additional)
P. Guttmann (additional)
S. Werner (additional)
K. Henzler (additional)
H. Du (additional)
J. Mayer (additional)
R. Waser (additional)
R. Dittmann (additional)

References 37 Referenced 34

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See supplementary material at http://dx.doi.org/10.1063/1.4822438 for details on PLD growth parameters and sample preparation.
{'volume-title': 'Handbook of Microscopy: Applications', 'year': '1997', 'key': '2023062217420556800_c16'} / Handbook of Microscopy: Applications (1997)
10.1002/adma.200803360 / Adv. Mater. (2009)
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Dates

Type	When
Created	11 years, 11 months ago (Oct. 2, 2013, 6:39 p.m.)
Deposited	2 years, 2 months ago (June 23, 2023, 12:06 a.m.)
Indexed	1 month ago (July 30, 2025, 7:01 a.m.)
Issued	11 years, 11 months ago (Oct. 1, 2013)
Published	11 years, 11 months ago (Oct. 1, 2013)
Published Online	11 years, 11 months ago (Oct. 1, 2013)
Published Print	11 years, 11 months ago (Oct. 1, 2013)

Funders 0

None

BibTeX

@article{Koehl_2013, title={Evidence for multifilamentary valence changes in resistive switching SrTiO3 devices detected by transmission X-ray microscopy}, volume={1}, ISSN={2166-532X}, url={http://dx.doi.org/10.1063/1.4822438}, DOI={10.1063/1.4822438}, number={4}, journal={APL Materials}, publisher={AIP Publishing}, author={Koehl, A. and Wasmund, H. and Herpers, A. and Guttmann, P. and Werner, S. and Henzler, K. and Du, H. and Mayer, J. and Waser, R. and Dittmann, R.}, year={2013}, month=oct }

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