Abstract
We report the interlayer screening effects of ultrathin MoS2 nanoflakes with different thicknesses by measuring their surface potential using Kelvin probe microscope. Surface potential of pristine MoS2 nanoflakes decreased with increasing thickness, while after annealing, the trend was opposite and the screening length became smaller. These results were qualitatively explained by a charge transfer model with the built-in electric field induced by trapped charges. The transport mechanism of MoS2 nanoflakes with different thicknesses was also studied by using conductive atomic force microscopy, and the thermonic emission and Fowler-Nordheim tunneling were effective in the forward bias and reverse bias, respectively.
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Dates
Type | When |
---|---|
Created | 12 years, 4 months ago (April 10, 2013, 6:13 p.m.) |
Deposited | 2 years, 2 months ago (June 24, 2023, 10:09 p.m.) |
Indexed | 1 day, 17 hours ago (Aug. 28, 2025, 8:49 a.m.) |
Issued | 12 years, 4 months ago (April 8, 2013) |
Published | 12 years, 4 months ago (April 8, 2013) |
Published Online | 12 years, 4 months ago (April 10, 2013) |
Published Print | 12 years, 4 months ago (April 8, 2013) |
@article{Li_2013, title={Surface potential and interlayer screening effects of few-layer MoS2 nanoflakes}, volume={102}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.4801844}, DOI={10.1063/1.4801844}, number={14}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Li, Yang and Xu, Cheng-Yan and Zhen, Liang}, year={2013}, month=apr }