Abstract
Chalcogenide materials have received great attention in the last decade owing to their application in new memory systems. Recently, phase-change memories have, in fact, reached the early stages of production. In spite of the industrial exploitation of such materials, the physical processes governing the switching mechanism are still debated. In this paper, we work out a complete and consistent model for transport in amorphous chalcogenide materials based on trap-limited conduction accompanied by carrier heating. A previous model is here extended to include position-dependent carrier concentration and field, consistently linked by the Poisson equation. The results of the new model reproduce the experimental electrical characteristics and their dependences on the device length and temperature. Furthermore, the model provides a sound physical interpretation of the switching phenomenon and is able to give an estimate of the threshold condition in terms of the material parameters, a piece of information of great technological interest.
References
24
Referenced
37
{'year': '2011', 'key': '2023070503082845400_c1'}
(2011)10.1109/JPROC.2003.818324
/ Proc. IEEE (2003){'volume': '2009', 'journal-title': 'Tech. Dig. - Int. Electron Devices Meet.', 'first-page': '617', 'key': '2023070503082845400_c3'}
/ Tech. Dig. - Int. Electron Devices Meet.10.1109/JPROC.2009.2035147
/ Proc. IEEE (2010)10.1109/JPROC.2010.2070050
/ Proc. IEEE (2010)10.1103/PhysRevLett.21.1450
/ Phys. Rev. Lett. (1968)10.1038/nmat2009
/ Nature Mater. (2007){'key': '2023070503082845400_c8', 'first-page': '48', 'volume': '21', 'year': '1996', 'journal-title': 'Mater. Res. Soc. Symp. Bull.'}
/ Mater. Res. Soc. Symp. Bull. (1996)10.1103/RevModPhys.50.209
/ Rev. Mod. Phys. (1978)10.1063/1.328036
/ J. Appl. Phys. (1980){'volume': '2001', 'journal-title': 'Tech. Dig. - Int. Electron Devices Meet.', 'first-page': '803', 'key': '2023070503082845400_c11'}
/ Tech. Dig. - Int. Electron Devices Meet.10.1109/TED.2003.823243
/ IEEE Trans. Electron Devices (2004)10.1109/TED.2011.2168402
/ IEEE Trans. Electron Devices (2011)10.1063/1.2715024
/ Appl. Phys. Lett. (2007)10.1063/1.3478713
/ J. Appl. Phys. (2010)10.1063/1.2773688
/ J. Appl. Phys. (2007)10.1103/PhysRevB.78.035308
/ Phys. Rev. B (2008)10.1063/1.3259421
/ J. Appl. Phys. (2009){'volume-title': 'Electronic Processes in Non-Crystalline Materials', 'year': '1979', 'key': '2023070503082845400_c19'}
/ Electronic Processes in Non-Crystalline Materials (1979){'volume-title': 'Electronic Properties of Doped Semiconductors', 'year': '1984', 'key': '2023070503082845400_c20'}
/ Electronic Properties of Doped Semiconductors (1984){'volume-title': 'Theory of Electron Transport in Semiconductors', 'year': '2010', 'key': '2023070503082845400_c21'}
/ Theory of Electron Transport in Semiconductors (2010)10.1016/j.jpcs.2007.01.017
/ J. Phys. Chem. Solids (2007)- See supplementary material at http://dx.doi.org/10.1063/1.4761997 for an animation showing the evolution of f(z), t(z), and n(z) as a function of the current.
10.1147/rd.135.0515
/ IBM J. Res. Dev. (1969)
Dates
Type | When |
---|---|
Created | 12 years, 9 months ago (Oct. 30, 2012, 6:12 p.m.) |
Deposited | 2 years, 1 month ago (July 5, 2023, 1:55 p.m.) |
Indexed | 3 weeks, 3 days ago (July 30, 2025, 6:59 a.m.) |
Issued | 12 years, 10 months ago (Oct. 15, 2012) |
Published | 12 years, 10 months ago (Oct. 15, 2012) |
Published Online | 12 years, 9 months ago (Oct. 29, 2012) |
Published Print | 12 years, 10 months ago (Oct. 15, 2012) |
@article{Piccinini_2012, title={Hot-carrier trap-limited transport in switching chalcogenides}, volume={112}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.4761997}, DOI={10.1063/1.4761997}, number={8}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Piccinini, Enrico and Cappelli, Andrea and Buscemi, Fabrizio and Brunetti, Rossella and Ielmini, Daniele and Rudan, Massimo and Jacoboni, Carlo}, year={2012}, month=oct }