Crossref journal-article
AIP Publishing
The Journal of Chemical Physics (317)
Abstract

Specular x-ray reflectivity has been used to probe the structures of self-assembled monolayers and multilayers deposited using a three-step siloxane-based self-assembly technique that is repeated to form periodic multilayers. In films containing up to ten trilayers, it is found that the film thickness increases linearly as a function of the number of trilayers with no observable change in the surface roughness. Bragg peaks corresponding to the inter-trilayer spacing are observed. Both of these results indicate high structural regularity in these self-assembled multilayers. In self-assembled films with different constituent molecular building blocks, substantial and unexpected changes in the film structure occur as a result of subtle changes in the layers.

Bibliography

Malik, A., Lin, W., Durbin, M. K., Marks, T. J., & Dutta, P. (1997). Specular x-ray reflectivity studies of microstructure and ordering in self-assembled multilayers. The Journal of Chemical Physics, 107(2), 645–652.

Authors 5
  1. A. Malik (first)
  2. W. Lin (additional)
  3. M. K. Durbin (additional)
  4. T. J. Marks (additional)
  5. P. Dutta (additional)
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Dates
Type When
Created 23 years, 1 month ago (July 26, 2002, 8:28 a.m.)
Deposited 1 year, 6 months ago (Feb. 10, 2024, 3:27 p.m.)
Indexed 1 year, 6 months ago (Feb. 10, 2024, 3:40 p.m.)
Issued 28 years, 1 month ago (July 8, 1997)
Published 28 years, 1 month ago (July 8, 1997)
Published Print 28 years, 1 month ago (July 8, 1997)
Funders 0

None

@article{Malik_1997, title={Specular x-ray reflectivity studies of microstructure and ordering in self-assembled multilayers}, volume={107}, ISSN={1089-7690}, url={http://dx.doi.org/10.1063/1.474425}, DOI={10.1063/1.474425}, number={2}, journal={The Journal of Chemical Physics}, publisher={AIP Publishing}, author={Malik, A. and Lin, W. and Durbin, M. K. and Marks, T. J. and Dutta, P.}, year={1997}, month=jul, pages={645–652} }