Abstract
Specular x-ray reflectivity has been used to probe the structures of self-assembled monolayers and multilayers deposited using a three-step siloxane-based self-assembly technique that is repeated to form periodic multilayers. In films containing up to ten trilayers, it is found that the film thickness increases linearly as a function of the number of trilayers with no observable change in the surface roughness. Bragg peaks corresponding to the inter-trilayer spacing are observed. Both of these results indicate high structural regularity in these self-assembled multilayers. In self-assembled films with different constituent molecular building blocks, substantial and unexpected changes in the film structure occur as a result of subtle changes in the layers.
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 8:28 a.m.) |
Deposited | 1 year, 6 months ago (Feb. 10, 2024, 3:27 p.m.) |
Indexed | 1 year, 6 months ago (Feb. 10, 2024, 3:40 p.m.) |
Issued | 28 years, 1 month ago (July 8, 1997) |
Published | 28 years, 1 month ago (July 8, 1997) |
Published Print | 28 years, 1 month ago (July 8, 1997) |
@article{Malik_1997, title={Specular x-ray reflectivity studies of microstructure and ordering in self-assembled multilayers}, volume={107}, ISSN={1089-7690}, url={http://dx.doi.org/10.1063/1.474425}, DOI={10.1063/1.474425}, number={2}, journal={The Journal of Chemical Physics}, publisher={AIP Publishing}, author={Malik, A. and Lin, W. and Durbin, M. K. and Marks, T. J. and Dutta, P.}, year={1997}, month=jul, pages={645–652} }