DOI: 10.1063/1.457295. X-ray structural characterization of larger CdSe semiconductor clusters

X-ray structural characterization of larger CdSe semiconductor clusters

10.1063/1.457295

Crossref journal-article

AIP Publishing

The Journal of Chemical Physics (317)

Abstract

X-ray powder patterns obtained from three different types of 35–40 Å CdSe nanoclusters are analyzed. We simulate the effects of thermal fluctuations, stacking faults, surface reconstructions, and bond compressions on powder patterns of CdSe clusters using the Debye formula. We find that the spectra of capped and annealed CdSe particles grown in inverse micelles are best fit by a mixture of crystalline structures intermediate between zinc-blende and wurtzite. We describe a new preparation for CdSe clusters, the structure of which appears to be well-defined wurtzite with, on average, less than one stacking fault per cluster. Thermal effects are found to be important and to mask the subtle effects of likely surface and core reconstructions.

Bibliography

Bawendi, M. G., Kortan, A. R., Steigerwald, M. L., & Brus, L. E. (1989). X-ray structural characterization of larger CdSe semiconductor clusters. The Journal of Chemical Physics, 91(11), 7282â7290.

Authors 4

M. G. Bawendi (first)
A. R. Kortan (additional)
M. L. Steigerwald (additional)
L. E. Brus (additional)

References 23 Referenced 253

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{'key': '2024021009151763800_r1a', 'first-page': '1909', 'volume': 'QE22', 'year': '1986', 'journal-title': 'IEEE J. Quantum Electron.'} / IEEE J. Quantum Electron. (1986)
10.1146/annurev.ms.19.080189.002351 / Annu. Rev. Mater. Sci. (1989)
{'key': '2024021009151763800_r1c'}
10.1063/1.455855 / J. Chem. Phys. (1989)
10.1063/1.454833 / J. Chem. Phys. (1988)
{'key': '2024021009151763800_r4'}
10.1063/1.455466 / J. Chem. Phys. (1988)
{'key': '2024021009151763800_r6'}
10.1103/PhysRevB.35.9085 / Phys. Rev. B (1987)
10.1021/ja00218a008 / J. Am. Chem. Soc. (1988)
{'key': '2024021009151763800_r9'}
{'key': '2024021009151763800_r10'}
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{'key': '2024021009151763800_r12'}
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{'key': '2024021009151763800_r14', 'first-page': '355', 'volume': '33', 'year': '1977', 'journal-title': 'Acta Crystallogr. Sect. A'} / Acta Crystallogr. Sect. A (1977)
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Dates

Type	When
Created	23 years ago (July 26, 2002, 9:21 a.m.)
Deposited	1 year, 6 months ago (Feb. 10, 2024, 5:59 a.m.)
Indexed	1 month ago (July 19, 2025, 11:59 p.m.)
Issued	35 years, 8 months ago (Dec. 1, 1989)
Published	35 years, 8 months ago (Dec. 1, 1989)
Published Print	35 years, 8 months ago (Dec. 1, 1989)

Funders 0

None

BibTeX

@article{Bawendi_1989, title={X-ray structural characterization of larger CdSe semiconductor clusters}, volume={91}, ISSN={1089-7690}, url={http://dx.doi.org/10.1063/1.457295}, DOI={10.1063/1.457295}, number={11}, journal={The Journal of Chemical Physics}, publisher={AIP Publishing}, author={Bawendi, M. G. and Kortan, A. R. and Steigerwald, M. L. and Brus, L. E.}, year={1989}, month=dec, pages={7282–7290} }

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