Abstract
A sputter ion source has been used to obtain beams of B−, Al−, Bi−, and Pb− ions. A mass analyzed beam of each of these ions was crossed with a fixed frequency argon ion laser operating at 488 nm, and a photoelectron spectrum obtained at a resolution of 60 meV. From an analysis of these data the following electron affinities were obtained: B, 0.278±0.010 eV; Al, 0.442±0.010 eV; Bi, 0.947±0.010 eV; Pb, 0.365±0.008 eV. In addition, a1D excited state of Al− was observed 0.332±0.010 eV above the ground state of the negative ion.
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Dates
Type | When |
---|---|
Created | 22 years, 6 months ago (Feb. 28, 2003, 10:46 a.m.) |
Deposited | 1 year, 6 months ago (Feb. 9, 2024, 5:13 p.m.) |
Indexed | 1 year, 1 month ago (Aug. 1, 2024, 8:14 p.m.) |
Issued | 44 years, 7 months ago (Jan. 15, 1981) |
Published | 44 years, 7 months ago (Jan. 15, 1981) |
Published Print | 44 years, 7 months ago (Jan. 15, 1981) |
@article{Feigerle_1981, title={Electron affinities of B, Al, Bi, and Pb}, volume={74}, ISSN={1089-7690}, url={http://dx.doi.org/10.1063/1.441174}, DOI={10.1063/1.441174}, number={2}, journal={The Journal of Chemical Physics}, publisher={AIP Publishing}, author={Feigerle, C. S. and Corderman, R. R. and Lineberger, W. C.}, year={1981}, month=jan, pages={1513–1515} }