Crossref journal-article
AIP Publishing
Journal of Applied Physics (317)
Abstract

The grain-size effect on the semiconductor-to-metal transition in ZnS has been investigated by in situ high-pressure electrical resistance and optical measurements. It is found that the grain-size effect can elevate the transition pressure of ZnS in a larger pressure range. On the basis of the results obtained and results reported in the literature, we demonstrate that the dangers of using the transition pressures of the II–VI compounds as pressure calibrators without a detailed knowledge of their grain-size effects on the transition pressures cannot be overstressed.

Bibliography

Jiang, J. Z., Gerward, L., Frost, D., Secco, R., Peyronneau, J., & Olsen, J. S. (1999). Grain-size effect on pressure-induced semiconductor-to-metal transition in ZnS. Journal of Applied Physics, 86(11), 6608–6610.

Authors 6
  1. J. Z. Jiang (first)
  2. L. Gerward (additional)
  3. D. Frost (additional)
  4. R. Secco (additional)
  5. J. Peyronneau (additional)
  6. J. S. Olsen (additional)
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Dates
Type When
Created 23 years, 1 month ago (July 26, 2002, 9:55 a.m.)
Deposited 1 year, 6 months ago (Feb. 10, 2024, 5:13 a.m.)
Indexed 1 month, 3 weeks ago (July 2, 2025, 1:51 p.m.)
Issued 25 years, 8 months ago (Dec. 1, 1999)
Published 25 years, 8 months ago (Dec. 1, 1999)
Published Print 25 years, 8 months ago (Dec. 1, 1999)
Funders 0

None

@article{Jiang_1999, title={Grain-size effect on pressure-induced semiconductor-to-metal transition in ZnS}, volume={86}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.371631}, DOI={10.1063/1.371631}, number={11}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Jiang, J. Z. and Gerward, L. and Frost, D. and Secco, R. and Peyronneau, J. and Olsen, J. S.}, year={1999}, month=dec, pages={6608–6610} }