Abstract
Epitaxial CrO2 thin films have been grown on TiO2(100) and Al2O3(0001) substrates by atmospheric pressure chemical vapor deposition. The films have a Curie temperature (Tc) of around 393 K with the ones grown on TiO2 exhibiting in-plane uniaxial magnetic anisotropy. They also display metallic characteristics, with room temperature resistivity of about 285 μΩ cm, dropping by about two orders of magnitude upon cooling down to 5 K. Magnetoresistance (MR) properties of the films have been measured with the magnetic field in the plane. For a field of 40 kOe, a positive transverse MR of about 25% at 5 K and a negative MR of about 7% at near Tc have been observed. In addition, Hall resistivity has been measured with magnetic field up to 40 kOe. A positive ordinary Hall effect is found at low temperatures, indicating the conduction carriers are holes.
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 9:55 a.m.) |
Deposited | 1 year, 6 months ago (Feb. 6, 2024, 6:29 p.m.) |
Indexed | 3 weeks, 1 day ago (Aug. 6, 2025, 7:59 a.m.) |
Issued | 26 years, 4 months ago (April 15, 1999) |
Published | 26 years, 4 months ago (April 15, 1999) |
Published Print | 26 years, 4 months ago (April 15, 1999) |
@article{Li_1999, title={Magnetoresistance and Hall effect of chromium dioxide epitaxial thin films}, volume={85}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.369807}, DOI={10.1063/1.369807}, number={8}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Li, X. W. and Gupta, A. and McGuire, T. R. and Duncombe, P. R. and Xiao, Gang}, year={1999}, month=apr, pages={5585–5587} }