Abstract
Graphene-based non-volatile memory devices composed of a single-layer graphene channel and an Al2O3/HfOx/Al2O3 charge-storage layer exhibit memory functionality. The impact of the gate material’s work-function (Φ) on the memory characteristics is investigated using different types of metals [Ti (ΦTi = 4.3 eV) and Ni (ΦNi = 5.2 eV)]. The ambipolar carrier conduction of graphene results in an enlargement of memory window (ΔVM), which is ∼4.5 V for the Ti-gate device and ∼9.1 V for the Ni-gate device. The increase in ΔVM is attributed to the change in the flat-band condition and the suppression of electron back-injection within the gate stack.
References
26
Referenced
44
10.1063/1.3271177
/ Appl. Phys. Lett. (2009)10.1063/1.3383234
/ Appl. Phys. Lett. (2010)10.1021/nn100234x
/ ACS Nano (2010)10.1063/1.3619816
/ Appl. Phys. Lett. (2011)10.1103/PhysRevLett.105.166602
/ Phys. Rev. Lett. (2010)10.1063/1.3630227
/ Appl. Phys. Lett. (2011)10.1002/adma.200903267
/ Adv. Mater. (2010)10.1021/nn201809k
/ ACS Nano (2011)10.1063/1.3259415
/ Appl. Phys. Lett. (2009)10.1063/1.3610571
/ Appl. Phys. Lett. (2011)10.1109/LED.2010.2053695
/ IEEE Electron Device Lett. (2010)10.1021/nl101902k
/ Nano Lett. (2010)10.1021/nl1006036
/ Nano Lett. (2010){'volume-title': 'Design, Semiconductor Industry Association', 'year': '2007', 'author': 'International Technology Roadmap for Semiconductors (ITRS)', 'key': '2023073100542766800_c14'}
/ Design, Semiconductor Industry Association by International Technology Roadmap for Semiconductors (ITRS) (2007)10.1021/nn102916c
/ ACS Nano (2011)10.1021/nl1036403
/ Nano Lett. (2011)10.1063/1.3077021
/ Appl. Phys. Lett. (2009){'volume-title': 'Silicon Nanoelectronics', 'year': '2006', 'key': '2023073100542766800_c18'}
/ Silicon Nanoelectronics (2006){'edition': '3rd ed.', 'volume-title': 'Semiconductor Material and Device Characterization', 'year': '2006', 'key': '2023073100542766800_c19'}
/ Semiconductor Material and Device Characterization (2006){'edition': '3rd ed.', 'volume-title': 'Physics of Semiconductor Devices', 'year': '2006', 'key': '2023073100542766800_c20'}
/ Physics of Semiconductor Devices (2006)10.1021/nl901572a
/ Nano Lett. (2009)10.1126/science.1158877
/ Science (2008)10.1103/RevModPhys.81.109
/ Rev. Mod. Phys. (2009)10.1038/nnano.2010.249
/ Nat. Nanotechnol. (2011)10.1038/nature08105
/ Nature (2009)10.1038/nphys2102
/ Nat. Phys. (2011)
Dates
Type | When |
---|---|
Created | 13 years, 7 months ago (Jan. 11, 2012, 9:23 a.m.) |
Deposited | 2 years ago (July 30, 2023, 8:54 p.m.) |
Indexed | 2 weeks, 2 days ago (Aug. 7, 2025, 4:52 p.m.) |
Issued | 13 years, 7 months ago (Jan. 9, 2012) |
Published | 13 years, 7 months ago (Jan. 9, 2012) |
Published Online | 13 years, 7 months ago (Jan. 10, 2012) |
Published Print | 13 years, 7 months ago (Jan. 9, 2012) |
@article{Lee_2012, title={Impact of gate work-function on memory characteristics in Al2O3/HfOx/Al2O3/graphene charge-trap memory devices}, volume={100}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.3675633}, DOI={10.1063/1.3675633}, number={2}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Lee, Sejoon and Song, Emil B. and Kim, Sungmin and Seo, David H. and Seo, Sunae and Won Kang, Tae and Wang, Kang L.}, year={2012}, month=jan }