DOI: 10.1063/1.367412. Quantitative magnetic force microscopy on perpendicularly magnetized samples

Quantitative magnetic force microscopy on perpendicularly magnetized samples

10.1063/1.367412

Crossref journal-article

AIP Publishing

Journal of Applied Physics (317)

Abstract

We present a transfer-function approach to calculate the force on a magnetic force microscope tip and the stray field due to a perpendicularly magnetized medium having an arbitrary magnetization pattern. Under certain conditions, it is possible to calculate the magnetization pattern from the measured force data. We apply this transfer function theory to quantitatively simulate magnetic force microscopy data acquired on a CoNi/Pt multilayer and on an epitaxially grown Cu/Ni/Cu/Si(001) magnetic thin film. The method described here serves as an excellent basis for (i) the definition of the condition for achieving maximum resolution in a specific experiment, (ii) the differences of force and force z-derivative imaging, (iii) the artificial distinction between domain and domain wall contrast, and finally (iv) the influence of various tip shapes on image content.

Bibliography

Hug, H. J., Stiefel, B., van Schendel, P. J. A., Moser, A., Hofer, R., Martin, S., GÃ¼ntherodt, H.-J., Porthun, S., Abelmann, L., Lodder, J. C., Bochi, G., & OâHandley, R. C. (1998). Quantitative magnetic force microscopy on perpendicularly magnetized samples. Journal of Applied Physics, 83(11), 5609â5620.

Authors 12

Hans J. Hug (first)
B. Stiefel (additional)
P. J. A. van Schendel (additional)
A. Moser (additional)
R. Hofer (additional)
S. Martin (additional)
H.-J. Güntherodt (additional)
Steffen Porthun (additional)
Leon Abelmann (additional)
J. C. Lodder (additional)
Gabriel Bochi (additional)
R. C. O’Handley (additional)

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Dates

Type	When
Created	23 years, 1 month ago (July 26, 2002, 8:31 a.m.)
Deposited	1 year, 6 months ago (Feb. 2, 2024, 4:13 p.m.)
Indexed	2 months, 4 weeks ago (May 31, 2025, 12:19 a.m.)
Issued	27 years, 2 months ago (June 1, 1998)
Published	27 years, 2 months ago (June 1, 1998)
Published Print	27 years, 2 months ago (June 1, 1998)

Funders 0

None

BibTeX

@article{Hug_1998, title={Quantitative magnetic force microscopy on perpendicularly magnetized samples}, volume={83}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.367412}, DOI={10.1063/1.367412}, number={11}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Hug, Hans J. and Stiefel, B. and van Schendel, P. J. A. and Moser, A. and Hofer, R. and Martin, S. and Güntherodt, H.-J. and Porthun, Steffen and Abelmann, Leon and Lodder, J. C. and Bochi, Gabriel and O’Handley, R. C.}, year={1998}, month=jun, pages={5609–5620} }

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