DOI: 10.1063/1.366557. The probe dynamics under shear force in near-field scanning optical microscopy

The probe dynamics under shear force in near-field scanning optical microscopy

10.1063/1.366557

Crossref journal-article

AIP Publishing

Journal of Applied Physics (317)

Abstract

We present here the results of theoretical as well as experimental studies of shear force interactions in near-field scanning optical microscopy. A continuum mechanical model that considers the realistic tapered fiber shape was used to calculate the shear force during the interactions. The frequency spectra at different probe/sample separations show that the shear force is a combination of elastic and frictional force. The relative strengths of these two forces depend on the tilt angle between the probe and the sample surface.

Bibliography

Wei, P. K., & Fann, W. S. (1998). The probe dynamics under shear force in near-field scanning optical microscopy. Journal of Applied Physics, 83(7), 3461â3468.

Authors 2

P. K. Wei (first)
W. S. Fann (additional)

References 18 Referenced 20

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{'key': '2024020220160442900_r12'}
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10.1063/1.115289 / Appl. Phys. Lett. (1995)
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Dates

Type	When
Created	23 years ago (July 26, 2002, 9:53 a.m.)
Deposited	1 year, 6 months ago (Feb. 2, 2024, 3:56 p.m.)
Indexed	1 year, 6 months ago (Feb. 10, 2024, 2:29 p.m.)
Issued	27 years, 4 months ago (April 1, 1998)
Published	27 years, 4 months ago (April 1, 1998)
Published Print	27 years, 4 months ago (April 1, 1998)

Funders 0

None

BibTeX

@article{Wei_1998, title={The probe dynamics under shear force in near-field scanning optical microscopy}, volume={83}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.366557}, DOI={10.1063/1.366557}, number={7}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Wei, P. K. and Fann, W. S.}, year={1998}, month=apr, pages={3461–3468} }

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