DOI: 10.1063/1.366541. A quantitative analysis of surface deformation by stick/slip atomic force microscopy

A quantitative analysis of surface deformation by stick/slip atomic force microscopy

10.1063/1.366541

Crossref journal-article

AIP Publishing

Journal of Applied Physics (317)

Abstract

This article presents a quantitative determination of static deformation at a nanometer scale of a surface caused by the tip of an atomic force microscope. An analysis of cantilever displacements while in contact with the surface leads to a directly measurable dimensionless parameter which is well sensitive to surface deformation. The method is specifically aimed at stick/slip friction measurements like on layered compounds, like TiS2 or on a relatively rigid surface of an ionic crystal, in this study NaCl [100]. Stick/slip friction images offer a possibility to investigate details of strain-dependent deformation. The observed deformation in TiS2could play an important role in the occurrence of strong stick/slip friction in this and other layered materials.

Bibliography

Kerssemakers, J., & De Hosson, J. Th. M. (1997). A quantitative analysis of surface deformation by stick/slip atomic force microscopy. Journal of Applied Physics, 82(8), 3763â3770.

Authors 2

J. Kerssemakers (first)
J. Th. M. De Hosson (additional)

References 20 Referenced 7

10.1016/0167-5729(95)00009-7 / Surf. Sci. Rep. (1996)
10.1063/1.362870 / J. Appl. Phys. (1996)
10.1063/1.114078 / Appl. Phys. Lett. (1995)
10.1016/0304-3991(93)90021-O / Ultramicroscopy (1993)
10.1063/1.119273 / Appl. Phys. Lett. (1997)
10.1063/1.1147411 / Rev. Sci. Instrum. (1996)
10.1063/1.118476 / Appl. Phys. Lett. (1997)
{'key': '2024020219410493900_r8', 'first-page': '14', 'volume': '52', 'year': '1995', 'journal-title': 'Phys. Rev. B'} / Phys. Rev. B (1995)
10.1016/0021-9797(90)90224-C / J. Colloid Interface Sci. (1990)
10.1098/rspa.1971.0141 / Proc. R. Soc. London, Ser. A (1971)
10.1116/1.589083 / J. Vac. Sci. Technol. B (1996)
10.1063/1.1144646 / Rev. Sci. Instrum. (1994)
10.1063/1.1145144 / Rev. Sci. Instrum. (1994)
10.1063/1.354137 / J. Appl. Phys. (1993)
10.1063/1.1145292 / Rev. Sci. Instrum. (1995)
10.1063/1.1145439 / Rev. Sci. Instrum. (1995)
10.1007/BF00348412 / Appl. Phys. A (1994)
10.1021/la00016a600 / Langmuir (1994)
{'key': '2024020219410493900_r19', 'first-page': '2101', 'volume': '53', 'year': '1996', 'journal-title': 'Phys. Rev. B'} / Phys. Rev. B (1996)
{'key': '2024020219410493900_r20'}

Dates

Type	When
Created	23 years, 1 month ago (July 26, 2002, 9:53 a.m.)
Deposited	1 year, 6 months ago (Feb. 2, 2024, 3:29 p.m.)
Indexed	1 year, 6 months ago (Feb. 6, 2024, 6:41 p.m.)
Issued	27 years, 10 months ago (Oct. 15, 1997)
Published	27 years, 10 months ago (Oct. 15, 1997)
Published Print	27 years, 10 months ago (Oct. 15, 1997)

Funders 0

None

BibTeX

@article{Kerssemakers_1997, title={A quantitative analysis of surface deformation by stick/slip atomic force microscopy}, volume={82}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.366541}, DOI={10.1063/1.366541}, number={8}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Kerssemakers, J. and De Hosson, J. Th. M.}, year={1997}, month=oct, pages={3763–3770} }

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