Crossref journal-article
AIP Publishing
Journal of Applied Physics (317)
Abstract

The static friction regime of an atomic force microscope tip on a soft material is analyzed. A mechanical model shows that the experimental response is characteristic of the complex modulus of the sample. Moduli deduced from experiments on styrene-butadiene films compare favorably with macroscopically determined ones. Small discrepancies can be attributed to the imprecise knowledge of the mechanical properties of the cantilever. Relative measurements should, however, be accurately made. Spatial resolution depends on mechanical and adhesive properties of the material. For the experiments shown, the resolution is a few microns. Contrary to others, this method is little dependent on the geometrical properties of the tip end since in this regime the tip is deeply intruded in the material. It applies on thin films and heterogeneous materials and provides a new method for determining the mechanical properties at a local scale.

Bibliography

Fretigny, C., Basire, C., & Granier, V. (1997). Determination of complex modulus by atomic force microscopy. Journal of Applied Physics, 82(1), 43–48.

Authors 3
  1. C. Fretigny (first)
  2. C. Basire (additional)
  3. V. Granier (additional)
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Dates
Type When
Created 23 years ago (July 26, 2002, 9:52 a.m.)
Deposited 1 year, 6 months ago (Feb. 2, 2024, 3:14 p.m.)
Indexed 1 year, 6 months ago (Feb. 10, 2024, 6:02 p.m.)
Issued 28 years, 1 month ago (July 1, 1997)
Published 28 years, 1 month ago (July 1, 1997)
Published Print 28 years, 1 month ago (July 1, 1997)
Funders 0

None

@article{Fretigny_1997, title={Determination of complex modulus by atomic force microscopy}, volume={82}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.365834}, DOI={10.1063/1.365834}, number={1}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Fretigny, C. and Basire, C. and Granier, V.}, year={1997}, month=jul, pages={43–48} }