Crossref journal-article
AIP Publishing
Journal of Applied Physics (317)
Abstract

The direct determination of the crystallographic orientation of graphene sheets was performed using lattice resolution atomic force microscopy images. A graphene sample, micromechanically exfoliated onto a SiO2 substrate showing well defined crystal edges, was imaged in lateral force mode. The lateral force images reveal the periodicity of the graphene hexagonal structure allowing the visualization of the lattice symmetries and determination of the crystal orientation. Crystal edges predominantly formed by zigzag or armchair directions were identified. The nature of the edges was confirmed by Raman spectroscopy.

Bibliography

Almeida, C. M., Carozo, V., Prioli, R., & Achete, C. A. (2011). Identification of graphene crystallographic orientation by atomic force microscopy. Journal of Applied Physics, 110(8).

Authors 4
  1. C. M. Almeida (first)
  2. V. Carozo (additional)
  3. R. Prioli (additional)
  4. C. A. Achete (additional)
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Dates
Type When
Created 13 years, 10 months ago (Oct. 18, 2011, 6:35 p.m.)
Deposited 2 years ago (Aug. 3, 2023, 1:42 a.m.)
Indexed 1 month ago (July 30, 2025, 6:57 a.m.)
Issued 13 years, 10 months ago (Oct. 15, 2011)
Published 13 years, 10 months ago (Oct. 15, 2011)
Published Online 13 years, 10 months ago (Oct. 18, 2011)
Published Print 13 years, 10 months ago (Oct. 15, 2011)
Funders 0

None

@article{Almeida_2011, title={Identification of graphene crystallographic orientation by atomic force microscopy}, volume={110}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.3642991}, DOI={10.1063/1.3642991}, number={8}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Almeida, C. M. and Carozo, V. and Prioli, R. and Achete, C. A.}, year={2011}, month=oct }