Crossref journal-article
AIP Publishing
Journal of Applied Physics (317)
Abstract

With the model of equivalent charge distribution, we calculated the exact electrostatic force acting on the real (conical) tip of an atomic force microscope. This model applies to a conductive tip in front of a conductive plane. We compared the equivalent charge model with several analytic models used to date to approximate the electrostatic forces and discussed their degree of validity. We estimated the contribution of the cantilever to the total force and showed, on the basis of theoretical calculations and experimental results, that the contribution of cantilever may constitute the essential part of the electrostatic force in the range of distances used in electrostatic force microscopy in the air.

Bibliography

Belaidi, S., Girard, P., & Leveque, G. (1997). Electrostatic forces acting on the tip in atomic force microscopy: Modelization and comparison with analytic expressions. Journal of Applied Physics, 81(3), 1023–1030.

Authors 3
  1. S. Belaidi (first)
  2. P. Girard (additional)
  3. G. Leveque (additional)
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Dates
Type When
Created 23 years, 1 month ago (July 26, 2002, 9:52 a.m.)
Deposited 1 year, 6 months ago (Feb. 2, 2024, 2:28 p.m.)
Indexed 3 weeks, 5 days ago (Aug. 2, 2025, 12:33 a.m.)
Issued 28 years, 6 months ago (Feb. 1, 1997)
Published 28 years, 6 months ago (Feb. 1, 1997)
Published Print 28 years, 6 months ago (Feb. 1, 1997)
Funders 0

None

@article{Belaidi_1997, title={Electrostatic forces acting on the tip in atomic force microscopy: Modelization and comparison with analytic expressions}, volume={81}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.363884}, DOI={10.1063/1.363884}, number={3}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Belaidi, S. and Girard, P. and Leveque, G.}, year={1997}, month=feb, pages={1023–1030} }