Abstract
Spectra of hole and electron traps of CuInSe2/CdS/ZnO photovoltaic devices have been investigated using deep-level transient spectroscopy. A decrease of the concentration of shallow electron traps and an increase of the hole trap concentration after an injection of electrons has been observed. The effect is metastable below 200 K. A proposed explanation is based on the idea that both levels belong to the same defect in a different charge state. A resemblance of the phenomena related to that defect and to ‘‘dangling bond’’-type centers in amorphous semiconductors has been indicated. Some consequences of defect conversion for current transport and performance of photovoltaic devices have been discussed.
References
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 9:50 a.m.) |
Deposited | 1 year, 7 months ago (Feb. 2, 2024, 2:08 p.m.) |
Indexed | 3 months, 2 weeks ago (May 22, 2025, 10:28 p.m.) |
Issued | 28 years, 9 months ago (Nov. 15, 1996) |
Published | 28 years, 9 months ago (Nov. 15, 1996) |
Published Print | 28 years, 9 months ago (Nov. 15, 1996) |
@article{Igalson_1996, title={The metastable changes of the trap spectra of CuInSe2-based photovoltaic devices}, volume={80}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.363631}, DOI={10.1063/1.363631}, number={10}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Igalson, M. and Schock, H. W.}, year={1996}, month=nov, pages={5765–5769} }