Crossref journal-article
AIP Publishing
Journal of Applied Physics (317)
Abstract

The attenuated total reflection Kretschmann configuration is used for exciting guided optical modes in thin mica sheets. It is shown that this allows for detecting an additional mica monolayer (1 nm thick) on top of a few micron thick mica waveguide and therefore will allow for the determination of the optical properties of ultrathin layers (Langmuir–Blodgett–Kuhn-self-assembly monolayers) on top of the mica surface. Optical waveguide microscopy was performed with this nearly ideal slab configuration, allowing for the detection of plateaus on the mica surface.

Bibliography

Lawall, R., & Knoll, W. (1994). Mica as a waveguiding support for investigating ultrathin layers. Journal of Applied Physics, 76(10), 5764–5768.

Authors 2
  1. R. Lawall (first)
  2. W. Knoll (additional)
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Dates
Type When
Created 23 years, 1 month ago (July 26, 2002, 9:47 a.m.)
Deposited 1 year, 7 months ago (Feb. 2, 2024, 9:25 a.m.)
Indexed 1 year, 7 months ago (Feb. 2, 2024, 9:41 a.m.)
Issued 30 years, 9 months ago (Nov. 15, 1994)
Published 30 years, 9 months ago (Nov. 15, 1994)
Published Print 30 years, 9 months ago (Nov. 15, 1994)
Funders 0

None

@article{Lawall_1994, title={Mica as a waveguiding support for investigating ultrathin layers}, volume={76}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.358387}, DOI={10.1063/1.358387}, number={10}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Lawall, R. and Knoll, W.}, year={1994}, month=nov, pages={5764–5768} }