DOI: 10.1063/1.357150. Imaging spectroscopy with the atomic force microscope

Imaging spectroscopy with the atomic force microscope

10.1063/1.357150

Crossref journal-article

AIP Publishing

Journal of Applied Physics (317)

Abstract

Force curve imaging spectroscopy involves acquiring a force–distance curve at each pixel of an atomic force microscope image. Processing of the resulting data yields images of sample hardness and tip-sample adhesion. These images resemble Z modulation images and the sum of forward and reverse friction images, respectively, and like them exhibit a number of potentially misleading contrast mechanisms. In particular, XY tip motion has a pronounced effect on hardness images and the meniscus force on adhesion images.

Bibliography

Baselt, D. R., & Baldeschwieler, J. D. (1994). Imaging spectroscopy with the atomic force microscope. Journal of Applied Physics, 76(1), 33â38.

Authors 2

David R. Baselt (first)
John D. Baldeschwieler (additional)

References 27 Referenced 73

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{'issue': '19', 'key': '2024020213124682000_r10c', 'first-page': '11', 'volume': '45', 'year': '1992', 'journal-title': 'Phys. Rev. B'} / Phys. Rev. B (1992)
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Dates

Type	When
Created	23 years ago (July 26, 2002, 9:24 a.m.)
Deposited	1 year, 6 months ago (Feb. 2, 2024, 8:53 a.m.)
Indexed	3 months ago (May 21, 2025, 2:53 a.m.)
Issued	31 years, 1 month ago (July 1, 1994)
Published	31 years, 1 month ago (July 1, 1994)
Published Print	31 years, 1 month ago (July 1, 1994)

Funders 0

None

BibTeX

@article{Baselt_1994, title={Imaging spectroscopy with the atomic force microscope}, volume={76}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.357150}, DOI={10.1063/1.357150}, number={1}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Baselt, David R. and Baldeschwieler, John D.}, year={1994}, month=jul, pages={33–38} }

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