DOI: 10.1063/1.356933. <i>In situ</i> magnetic and structural analysis of epitaxial Ni80Fe20 thin films for spin-valve heterostructures

In situ magnetic and structural analysis of epitaxial Ni80Fe20 thin films for spin-valve heterostructures

10.1063/1.356933

Crossref journal-article

AIP Publishing

Journal of Applied Physics (317)

Abstract

We have investigated structural and magnetic properties of epitaxial (100) Ni80Fe20 films grown on relaxed Cu/Si(100) seed layers. The crystallographic texture and orientation of these films was analyzed in situ by reflection high energy electron diffraction (RHEED), and ex situ by x-ray diffraction and cross-sectional transmission electron microscopy (XTEM). In particular, RHEED intensities were recorded during epitaxial growth, and intensity profiles across Bragg rods were used to calculate the surface lattice constant, and hence the film strain. XTEM analysis indicated that the epitaxial films had atomically abrupt interfaces. The magnetic properties of these epitaxial films were measured in situ using magneto-optic Kerr effect magnetometry. Large Hc (10–20 Oe) was observed for epitaxial Ni80Fe20 (100) films less than 10.0 nm thick whereas for larger thicknesses, Hc decreased to a few Oe with the appearance of a uniaxial anisotropy. Correlations were made between magnetic properties of these epitaxial films and the strain in the film.

Bibliography

Hashim, I., & Atwater, H. A. (1994). In situ magnetic and structural analysis of epitaxial Ni80Fe20 thin films for spin-valve heterostructures. Journal of Applied Physics, 75(10), 6516â6518.

Authors 2

I. Hashim (first)
H. A. Atwater (additional)

References 17 Referenced 19

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{'key': '2024020212451223600_r6', 'volume': '313', 'year': '1993', 'journal-title': 'Mater. Res. Soc. Proc.'} / Mater. Res. Soc. Proc. (1993)
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Dates

Type	When
Created	23 years, 1 month ago (July 26, 2002, 8:46 a.m.)
Deposited	1 year, 6 months ago (Feb. 2, 2024, 8:32 a.m.)
Indexed	1 year, 4 months ago (April 6, 2024, 1:55 p.m.)
Issued	31 years, 3 months ago (May 15, 1994)
Published	31 years, 3 months ago (May 15, 1994)
Published Print	31 years, 3 months ago (May 15, 1994)

Funders 0

None

BibTeX

@article{Hashim_1994, title={In situ magnetic and structural analysis of epitaxial Ni80Fe20 thin films for spin-valve heterostructures}, volume={75}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.356933}, DOI={10.1063/1.356933}, number={10}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Hashim, I. and Atwater, H. A.}, year={1994}, month=may, pages={6516–6518} }

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