Abstract
The analysis of the static deflection of cantilever plates is of fundamental importance in application to the atomic force microscope (AFM). In this paper we present a detailed theoretical study of the deflection of such cantilevers. This shall incorporate the presentation of approximate analytical methods applicable in the analysis of arbitrary cantilevers, and a discussion of their limitations and accuracies. Furthermore, we present results of a detailed finite element analysis for a current AFM cantilever, which will be of value to the users of the AFM.
References
12
Referenced
166
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Dates
Type | When |
---|---|
Created | 23 years ago (July 26, 2002, 9:46 a.m.) |
Deposited | 1 year, 6 months ago (Feb. 2, 2024, 6:28 a.m.) |
Indexed | 1 year, 1 month ago (July 5, 2024, 4:27 a.m.) |
Issued | 32 years, 1 month ago (July 1, 1993) |
Published | 32 years, 1 month ago (July 1, 1993) |
Published Print | 32 years, 1 month ago (July 1, 1993) |
@article{Sader_1993, title={Theoretical analysis of the static deflection of plates for atomic force microscope applications}, volume={74}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.354137}, DOI={10.1063/1.354137}, number={1}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Sader, John Elie and White, Lee}, year={1993}, month=jul, pages={1–9} }