Crossref journal-article
AIP Publishing
Journal of Applied Physics (317)
Abstract

The analysis of the static deflection of cantilever plates is of fundamental importance in application to the atomic force microscope (AFM). In this paper we present a detailed theoretical study of the deflection of such cantilevers. This shall incorporate the presentation of approximate analytical methods applicable in the analysis of arbitrary cantilevers, and a discussion of their limitations and accuracies. Furthermore, we present results of a detailed finite element analysis for a current AFM cantilever, which will be of value to the users of the AFM.

Bibliography

Sader, J. E., & White, L. (1993). Theoretical analysis of the static deflection of plates for atomic force microscope applications. Journal of Applied Physics, 74(1), 1–9.

Authors 2
  1. John Elie Sader (first)
  2. Lee White (additional)
References 12 Referenced 166
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Dates
Type When
Created 23 years ago (July 26, 2002, 9:46 a.m.)
Deposited 1 year, 6 months ago (Feb. 2, 2024, 6:28 a.m.)
Indexed 1 year, 1 month ago (July 5, 2024, 4:27 a.m.)
Issued 32 years, 1 month ago (July 1, 1993)
Published 32 years, 1 month ago (July 1, 1993)
Published Print 32 years, 1 month ago (July 1, 1993)
Funders 0

None

@article{Sader_1993, title={Theoretical analysis of the static deflection of plates for atomic force microscope applications}, volume={74}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.354137}, DOI={10.1063/1.354137}, number={1}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Sader, John Elie and White, Lee}, year={1993}, month=jul, pages={1–9} }