DOI: 10.1063/1.353583. Noise analysis and image focusing for magnetic force microscopy

Noise analysis and image focusing for magnetic force microscopy

10.1063/1.353583

Crossref journal-article

AIP Publishing

Journal of Applied Physics (317)

Abstract

Magnetic force microscopy (MFM) has been widely utilized to reveal magnetization distributions by sensing the external magnetic-field distribution very close to the sample. The resolution of MFM is determined by the size of the sensor tip and by the spacing between the tip and the measured sample. A technique is developed to analyze the noise and linearity of a MFM image, and consequently to improve the spatial resolution by reducing the spacing loss. As a demonstration, a series of MFM images of a single permalloy particle is obtained and numerically analyzed. The spacing loss is reduced and a much higher resolution image is obtained.

Bibliography

Che, X., Lederman, M., Gibson, G. A., Bertram, H. N., & Schultz, S. (1993). Noise analysis and image focusing for magnetic force microscopy. Journal of Applied Physics, 73(10), 5805â5807.

Authors 5

Xiaodong Che (first)
M. Lederman (additional)
G. A. Gibson (additional)
H. N. Bertram (additional)
S. Schultz (additional)

References 14 Referenced 9

10.1063/1.97800 / Appl. Phys. Lett. (1987)
10.1063/1.339105 / J. Appl. Phys. (1987)
10.1116/1.575425 / J. Vac. Sci. Technol. A (1988)
10.1063/1.343628 / J. Appl. Phys. (1989)
10.1063/1.101898 / Appl. Phys. Lett. (1989)
{'key': '2024020417005618100_r6', 'first-page': '5187', 'volume': 'MAG-27', 'year': '1991', 'journal-title': 'IEEE Trans. Magn.'} / IEEE Trans. Magn. (1991)
10.1063/1.99952 / Appl. Phys. Lett. (1988)
10.1063/1.346713 / J. Appl. Phys. (1990)
10.1063/1.99482 / Appl. Phys. Lett. (1988)
{'key': '2024020417005618100_r10', 'first-page': '3138', 'volume': 'MAG-28', 'year': '1992', 'journal-title': 'IEEE Trans. Magn.'} / IEEE Trans. Magn. (1992)
{'key': '2024020417005618100_r11', 'first-page': '3467', 'volume': 'MAG-25', 'year': '1989', 'journal-title': 'IEEE Trans. Magn.'} / IEEE Trans. Magn. (1989)
10.1063/1.99965 / Appl. Phys. Lett. (1988)
{'key': '2024020417005618100_r13'}
10.1063/1.338807 / J. Appl. Phys. (1987)

Dates

Type	When
Created	23 years, 1 month ago (July 26, 2002, 9:45 a.m.)
Deposited	1 year, 7 months ago (Feb. 4, 2024, 12:01 p.m.)
Indexed	1 year, 7 months ago (Feb. 4, 2024, 12:40 p.m.)
Issued	32 years, 3 months ago (May 15, 1993)
Published	32 years, 3 months ago (May 15, 1993)
Published Print	32 years, 3 months ago (May 15, 1993)

Funders 0

None

BibTeX

@article{Che_1993, title={Noise analysis and image focusing for magnetic force microscopy}, volume={73}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.353583}, DOI={10.1063/1.353583}, number={10}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Che, Xiaodong and Lederman, M. and Gibson, G. A. and Bertram, H. N. and Schultz, S.}, year={1993}, month=may, pages={5805–5807} }

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