Abstract
Molecular dynamics simulations of the deposition of atomic H on both c-Si and a-Si:H substrates are performed to understand the physical processes occurring in the presence of an atomic H flux during growth. The absorption probability, and dynamical behavior of the H are studied as a function of the incident H energy. Both hydrogen absorption and backscattering events are observed. The hydrogen reflection probability has a maximum around 50 eV and decreases at higher incident kinetic energies. In the hydrogen backscattering events a substantial subsurface penetration and energy transfer through collisions are observed. Hydrogen absorption events have been closely analyzed and a surface hydrogen release event was observed during an absorption event.
References
10
Referenced
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 9:15 a.m.) |
Deposited | 1 year, 7 months ago (Feb. 4, 2024, 11:40 a.m.) |
Indexed | 1 year, 7 months ago (Feb. 4, 2024, 12:10 p.m.) |
Issued | 32 years, 5 months ago (April 1, 1993) |
Published | 32 years, 5 months ago (April 1, 1993) |
Published Print | 32 years, 5 months ago (April 1, 1993) |
@article{Biswas_1993, title={Simulations of hydrogen deposition processes in a-Si:H film growth}, volume={73}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.352977}, DOI={10.1063/1.352977}, number={7}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Biswas, R.}, year={1993}, month=apr, pages={3295–3298} }