Abstract
The brightness of nanometer-sized field-emission-electron sources have been measured experimentally. Ultrasharp tungsten (111) single-crystal tips were fabricated in situ using Ne sputtering and field evaporation, and monitored using field ion microscopy. The average brightness of single-atom-terminated nanotips was found to be 3.3×108 A cm−2 sr−1 at 470 V, or 7.7×1010 A cm−2 sr−1 when extrapolated to 100 kV. These results show an improvement of about two orders of magnitude in source brightness over existing cold field-emission-electron sources, and produce a beam with greater particle flux per unit energy than those obtainable using current synchrotron/wiggler/undulator devices.
References
30
Referenced
59
10.1147/rd.305.0460
/ IBM J. Res. Develop. (1986)10.1088/0031-8949/38/2/029
/ Phys. Scr. (1988){'key': '2024020417195263700_r2', 'first-page': '9931', 'volume': '1', 'year': '1989', 'journal-title': 'J. Phys.: Condens. Matter'}
/ J. Phys.: Condens. Matter (1989){'key': '2024020417195263700_r3', 'first-page': '46', 'volume': '77', 'year': '1987', 'journal-title': 'Optik'}
/ Optik (1987)10.1088/0508-3443/3/2/302
/ Brit. J. Appl. Phys. (1952){'key': '2024020417195263700_r5'}
{'key': '2024020417195263700_r6'}
10.1016/0304-3991(84)90045-7
/ Ultramicroscopy (1984)10.1016/S0065-2539(08)60236-X
/ Adv. Electr. Electron Phys. (1973){'key': '2024020417195263700_r9', 'first-page': '211', 'volume': '17', 'year': '1957', 'journal-title': 'J. Brit. I.R.E.'}
/ J. Brit. I.R.E. (1957){'key': '2024020417195263700_r10'}
10.1103/PhysRevLett.63.1499
/ Phys. Rev. Lett. (1989)10.1103/PhysRevB.42.9221
/ Phys. Rev. (1990)10.1103/PhysRevLett.69.2527
/ Phys. Rev. Lett. (1992)10.1063/1.108972
/ Appl. Phys. Lett. (1993)10.1063/1.353151
/ J. Appl. Phys. (1993){'key': '2024020417195263700_r16'}
{'key': '2024020417195263700_r17'}
{'key': '2024020417195263700_r18'}
10.1103/PhysRevLett.67.1543
/ Phys. Rev. Lett. (1991)10.1088/0022-3727/4/1/316
/ J. Phys. D (1971)10.1111/j.1365-2818.1988.tb01396.x
/ J. Microsc. (1988)10.1147/rd.305.0460
/ IBM J. Res. Dev. (1986)10.1103/PhysRevB.45.10271
/ Phys. Rev. B (1992){'key': '2024020417195263700_r24'}
{'key': '2024020417195263700_r25'}
{'key': '2024020417195263700_r26'}
{'key': '2024020417195263700_r27'}
{'key': '2024020417195263700_r28', 'first-page': '213', 'volume': '50', 'year': '1978', 'journal-title': 'Optik'}
/ Optik (1978)10.1063/1.1141002
/ Rev. Sci. Instrum. (1989)
Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 9:15 a.m.) |
Deposited | 1 year, 7 months ago (Feb. 4, 2024, 12:20 p.m.) |
Indexed | 1 year ago (Sept. 4, 2024, 12:56 p.m.) |
Issued | 32 years, 3 months ago (June 1, 1993) |
Published | 32 years, 3 months ago (June 1, 1993) |
Published Print | 32 years, 3 months ago (June 1, 1993) |
@article{Qian_1993, title={Brightness measurements of nanometer-sized field-emission-electron sources}, volume={73}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.352371}, DOI={10.1063/1.352371}, number={11}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Qian, W. and Scheinfein, M. R. and Spence, J. C. H.}, year={1993}, month=jun, pages={7041–7045} }