Crossref journal-article
AIP Publishing
Journal of Applied Physics (317)
Abstract

The brightness of nanometer-sized field-emission-electron sources have been measured experimentally. Ultrasharp tungsten (111) single-crystal tips were fabricated in situ using Ne sputtering and field evaporation, and monitored using field ion microscopy. The average brightness of single-atom-terminated nanotips was found to be 3.3×108 A cm−2 sr−1 at 470 V, or 7.7×1010 A cm−2 sr−1 when extrapolated to 100 kV. These results show an improvement of about two orders of magnitude in source brightness over existing cold field-emission-electron sources, and produce a beam with greater particle flux per unit energy than those obtainable using current synchrotron/wiggler/undulator devices.

Bibliography

Qian, W., Scheinfein, M. R., & Spence, J. C. H. (1993). Brightness measurements of nanometer-sized field-emission-electron sources. Journal of Applied Physics, 73(11), 7041–7045.

Authors 3
  1. W. Qian (first)
  2. M. R. Scheinfein (additional)
  3. J. C. H. Spence (additional)
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Dates
Type When
Created 23 years, 1 month ago (July 26, 2002, 9:15 a.m.)
Deposited 1 year, 7 months ago (Feb. 4, 2024, 12:20 p.m.)
Indexed 1 year ago (Sept. 4, 2024, 12:56 p.m.)
Issued 32 years, 3 months ago (June 1, 1993)
Published 32 years, 3 months ago (June 1, 1993)
Published Print 32 years, 3 months ago (June 1, 1993)
Funders 0

None

@article{Qian_1993, title={Brightness measurements of nanometer-sized field-emission-electron sources}, volume={73}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.352371}, DOI={10.1063/1.352371}, number={11}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Qian, W. and Scheinfein, M. R. and Spence, J. C. H.}, year={1993}, month=jun, pages={7041–7045} }