Crossref journal-article
AIP Publishing
Journal of Applied Physics (317)
Abstract

A model for electron transport and emission in CsI is proposed. It is based on theoretically calculated microscopic cross sections for electron interaction with the nuclear and the electronic components of the solid. A Monte Carlo program based on this model was developed to simulate secondary electron emission induced by x rays and electrons in the energy range of 1 to 10 keV. The calculated secondary emission yields agree with existing experimental data. The model provides all necessary characteristics for the design of radiation detectors based on secondary electron emission. It can be expanded to higher incident energies and other alkali halides.

Bibliography

Akkerman, A., Gibrekhterman, A., Breskin, A., & Chechik, R. (1992). Monte Carlo simulations of secondary electron emission from CsI, induced by 1–10 keV x rays and electrons. Journal of Applied Physics, 72(11), 5429–5436.

Authors 4
  1. A. Akkerman (first)
  2. A. Gibrekhterman (additional)
  3. A. Breskin (additional)
  4. R. Chechik (additional)
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Dates
Type When
Created 23 years, 1 month ago (July 26, 2002, 8:35 a.m.)
Deposited 1 year, 6 months ago (Feb. 4, 2024, 11:14 a.m.)
Indexed 5 months, 1 week ago (March 24, 2025, 2:31 a.m.)
Issued 32 years, 9 months ago (Dec. 1, 1992)
Published 32 years, 9 months ago (Dec. 1, 1992)
Published Print 32 years, 9 months ago (Dec. 1, 1992)
Funders 0

None

@article{Akkerman_1992, title={Monte Carlo simulations of secondary electron emission from CsI, induced by 1–10 keV x rays and electrons}, volume={72}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.351984}, DOI={10.1063/1.351984}, number={11}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Akkerman, A. and Gibrekhterman, A. and Breskin, A. and Chechik, R.}, year={1992}, month=dec, pages={5429–5436} }