Abstract
Selective epitaxial growth of GaAs was carried out by atmospheric pressure-metalorganic chemical vapor deposition using W and SiO2 masks, and a deposition-free region was clearly observed along the edge of the masks. The surface concentration of the reactant species on the masks was analyzed by a surface-diffusion model and a new method to estimate the surface-diffusion length on the masks was proposed. The surface-diffusion length on SiO2 and W masks were 0.45 and 0.07 μm at 610 °C, respectively. The surface-diffusion length increased with decreasing the substrate temperature and became longer on the masks irradiated by an atom beam.
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 9:45 a.m.) |
Deposited | 1 year, 7 months ago (Feb. 4, 2024, 11:11 a.m.) |
Indexed | 3 months ago (June 6, 2025, 9:05 a.m.) |
Issued | 32 years, 8 months ago (Dec. 15, 1992) |
Published | 32 years, 8 months ago (Dec. 15, 1992) |
Published Print | 32 years, 8 months ago (Dec. 15, 1992) |
@article{Yamaguchi_1992, title={Surface-diffusion model in selective metalorganic chemical vapor deposition}, volume={72}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.351900}, DOI={10.1063/1.351900}, number={12}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Yamaguchi, Ko-ichi and Ogasawara, Masaaki and Okamoto, Kotaro}, year={1992}, month=dec, pages={5919–5925} }