DOI: 10.1063/1.3494529. Mechanically-exfoliated stacks of thin films of Bi2Te3 topological insulators with enhanced thermoelectric performance

Mechanically-exfoliated stacks of thin films of Bi2Te3 topological insulators with enhanced thermoelectric performance

10.1063/1.3494529

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

The authors report on “graphene-like” mechanical exfoliation of single-crystal Bi2Te3 films and thermoelectric characterization of the stacks of such films. Thermal conductivity of the resulting “pseudosuperlattices” was measured by the “hot disk” and “laser flash” techniques. The room temperature in-plane (cross-plane) thermal conductivity of the stacks decreases by a factor of ∼2.4 (3.5) as compared to bulk. The thermal conductivity reduction with preserved electrical properties leads to strong increase in the thermoelectric figure of merit. It is suggested that the film thinning to few-quintuples and tuning of the Fermi level can help in achieving the topological-insulator surface transport regime with an extraordinary thermoelectric efficiency.

Bibliography

Goyal, V., Teweldebrhan, D., & Balandin, A. A. (2010). Mechanically-exfoliated stacks of thin films of Bi2Te3 topological insulators with enhanced thermoelectric performance. Applied Physics Letters, 97(13).

Authors 3

V. Goyal (first)
D. Teweldebrhan (additional)
A. A. Balandin (additional)

References 27 Referenced 168

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{'first-page': '1', 'volume-title': 'Heat Transfer in Micro- and Nanoscale Photonic Devices', 'year': '1996', 'key': '2023073107393246300_c3'} / Heat Transfer in Micro- and Nanoscale Photonic Devices (1996)
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P. Ghaemi , R. S. K.Mong , and J. E.Moore , In-plane transport and enhanced TE in thin films of the TIs Bi2Te3 and Bi2Se3, arXiv:1002.1341 (unpublished);
Independently, F. Zahid and R. Lake (UCR) predicted ZT of up to 7.2 at RT for Bi2Te3 films of certain thicknesses and doping densities, arXiv:1009.4512 (unpublished).
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Dates

Type	When
Created	14 years, 11 months ago (Oct. 2, 2010, 6:54 p.m.)
Deposited	2 years, 1 month ago (July 31, 2023, 3:39 a.m.)
Indexed	1 week, 3 days ago (Aug. 23, 2025, 9:18 p.m.)
Issued	14 years, 11 months ago (Sept. 27, 2010)
Published	14 years, 11 months ago (Sept. 27, 2010)
Published Online	14 years, 11 months ago (Oct. 1, 2010)
Published Print	14 years, 11 months ago (Sept. 27, 2010)

Funders 0

None

BibTeX

@article{Goyal_2010, title={Mechanically-exfoliated stacks of thin films of Bi2Te3 topological insulators with enhanced thermoelectric performance}, volume={97}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.3494529}, DOI={10.1063/1.3494529}, number={13}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Goyal, V. and Teweldebrhan, D. and Balandin, A. A.}, year={2010}, month=sep }

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