Abstract
We report the experimental observation of an intriguing behavior of multiple-level threshold switching of Si–In2Se3 heterojunction devices consisting of high-density arrays of sharp points of nanometer radius of curvature. Comparison with devices of similar junction area but without the sharp points shows that the multiple-level switching behavior is unique to devices with junctions consisting of sharp points.
References
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Dates
Type | When |
---|---|
Created | 14 years, 11 months ago (Sept. 3, 2010, 7:57 p.m.) |
Deposited | 2 years, 1 month ago (July 2, 2023, 10:10 p.m.) |
Indexed | 3 weeks, 2 days ago (July 30, 2025, 6:55 a.m.) |
Issued | 14 years, 11 months ago (Aug. 30, 2010) |
Published | 14 years, 11 months ago (Aug. 30, 2010) |
Published Online | 14 years, 11 months ago (Sept. 3, 2010) |
Published Print | 14 years, 11 months ago (Aug. 30, 2010) |
@article{Lee_2010, title={Multiple-level threshold switching behavior of In2Se3 confined in a nanostructured silicon substrate}, volume={97}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.3486122}, DOI={10.1063/1.3486122}, number={9}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Lee, Jae Young and Sun, Ke and Li, Biyun and Xie, Ya-Hong and Wei, Xinyu and Russell, Thomas P.}, year={2010}, month=aug }