Crossref journal-article
AIP Publishing
Journal of Applied Physics (317)
Abstract

In purely c-axis oriented PbZr0.2Ti0.8O3 ferroelectric thin films, a lateral piezoresponse force microscopy signal is observed at the position of 180° domain walls, where the out-of-plane oriented polarization is reversed. Using electric force microscopy measurements we exclude electrostatic effects as the origin of this signal. Moreover, our mechanical simulations of the tip/cantilever system show that the small tilt of the surface at the domain wall below the tip does not satisfactorily explain the observed signal either. We thus attribute this lateral piezoresponse at domain walls to their sideways motion (shear) under the applied electric field. From simple elastic considerations and the conservation of volume of the unit cell, we would expect a similar lateral signal more generally in other ferroelectric materials, and for all types of domain walls in which the out-of-plane component of the polarization is reversed through the domain wall. We show that in BiFeO3 thin films, with 180°, 109°, and 71° domain walls, this is indeed the case.

Bibliography

Guyonnet, J., Béa, H., & Paruch, P. (2010). Lateral piezoelectric response across ferroelectric domain walls in thin films. Journal of Applied Physics, 108(4).

Authors 3
  1. J. Guyonnet (first)
  2. H. Béa (additional)
  3. P. Paruch (additional)
References 42 Referenced 21
  1. 10.1038/nature05023 / Nature (London) (2006)
  2. 10.1038/nmat2373 / Nature Mater. (2009)
  3. 10.1103/PhysRevLett.99.167601 / Phys. Rev. Lett. (2007)
  4. 10.1103/PhysRevB.75.174109 / Phys. Rev. B (2007)
  5. 10.1063/1.107693 / Appl. Phys. Lett. (1992)
  6. 10.1063/1.117957 / Appl. Phys. Lett. (1996)
  7. 10.1063/1.122914 / Appl. Phys. Lett. (1998)
  8. 10.1017/S1431927606060156 / Microsc. Microanal. (2006)
  9. 10.1063/1.2010603 / Appl. Phys. Lett. (2005)
  10. 10.1063/1.123266 / Appl. Phys. Lett. (1999)
  11. 10.1063/1.2827566 / Appl. Phys. Lett. (2007)
  12. 10.1111/j.1365-2818.2007.01783.x / J. Microsc. (2007)
  13. 10.1103/PhysRevLett.89.097601 / Phys. Rev. Lett. (2002)
  14. 10.1063/1.2337356 / J. Appl. Phys. (2006)
  15. 10.1103/PhysRevLett.94.197601 / Phys. Rev. Lett. (2005)
  16. 10.1103/PhysRevB.78.054101 / Phys. Rev. B (2008)
  17. 10.1103/PhysRevB.78.125407 / Phys. Rev. B (2008)
  18. 10.1103/PhysRevLett.100.027602 / Phys. Rev. Lett. (2008)
  19. 10.1063/1.1421219 / J. Appl. Phys. (2002)
  20. 10.1063/1.1455700 / Appl. Phys. Lett. (2002)
  21. 10.1103/PhysRevB.72.024103 / Phys. Rev. B (2005)
  22. 10.1063/1.2234303 / Appl. Phys. Lett. (2006)
  23. {'key': '2023070322201048800_c23'}
  24. 10.1063/1.2940327 / Appl. Phys. Lett. (2008)
  25. 10.1080/09500830701235802 / Philos. Mag. Lett. (2007)
  26. {'key': '2023070322201048800_c26'}
  27. 10.1103/PhysRevB.65.125408 / Phys. Rev. B (2002)
  28. 10.1063/1.3226654 / Appl. Phys. Lett. (2009)
  29. 10.1088/0957-4484/17/6/014 / Nanotechnology (2006)
  30. {'key': '2023070322201048800_c30'}
  31. 10.1063/1.124722 / Appl. Phys. Lett. (1999)
  32. {'year': '2009', 'key': '2023070322201048800_c32'} (2009)
  33. {'key': '2023070322201048800_c33'}
  34. {'key': '2023070322201048800_c34'}
  35. {'key': '2023070322201048800_c35'}
  36. {'key': '2023070322201048800_c36'}
  37. 10.1016/S0263-2241(99)00004-4 / Measurement (1999)
  38. 10.1016/j.ultramic.2004.09.009 / Ultramicroscopy (2005)
  39. 10.1063/1.2126804 / Appl. Phys. Lett. (2005)
  40. H. Béa, M. Bibes, A. Barthélémy, and P. Paruch, e-print arXiv:condmat/0907.4568.
  41. 10.1038/nnano.2009.293 / Nat. Nanotechnol. (2009)
  42. 10.1063/1.1787897 / Appl. Phys. Lett. (2004)
Dates
Type When
Created 15 years ago (Aug. 31, 2010, 7:04 p.m.)
Deposited 2 years, 2 months ago (July 3, 2023, 8:34 p.m.)
Indexed 1 month ago (July 30, 2025, 6:54 a.m.)
Issued 15 years ago (Aug. 15, 2010)
Published 15 years ago (Aug. 15, 2010)
Published Online 15 years ago (Aug. 31, 2010)
Published Print 15 years ago (Aug. 15, 2010)
Funders 0

None

@article{Guyonnet_2010, title={Lateral piezoelectric response across ferroelectric domain walls in thin films}, volume={108}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.3474953}, DOI={10.1063/1.3474953}, number={4}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Guyonnet, J. and Béa, H. and Paruch, P.}, year={2010}, month=aug }