Abstract
We found different nonvolatile memory effects between ferroelectric and resistive switching in Pt/PbZr0.3Ti0.7O3(PZT)/La0.5Sr0.5CoO3 (LSCO) heterostructures, depending on thickness of epitaxial PZT films. As the film thickness decreased below 34 nm, leakage and/or tunneling currents increased and hindered ferroelectric switching of films; alternatively, bipolar resistive switching was observed. Analysis using fitting plot on resistive switching behaviors suggested that variable Schottky barrier at the interface between Pt electrode and the film may be responsible for the different nonvolatile memory switching.
References
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Dates
Type | When |
---|---|
Created | 15 years, 1 month ago (July 2, 2010, 6:59 p.m.) |
Deposited | 2 years ago (Aug. 1, 2023, 12:58 a.m.) |
Indexed | 1 month ago (July 30, 2025, 6:54 a.m.) |
Issued | 15 years, 2 months ago (June 28, 2010) |
Published | 15 years, 2 months ago (June 28, 2010) |
Published Online | 15 years, 1 month ago (July 2, 2010) |
Published Print | 15 years, 2 months ago (June 28, 2010) |
@article{Choi_2010, title={Different nonvolatile memory effects in epitaxial Pt/PbZr0.3Ti0.7O3/LSCO heterostructures}, volume={96}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.3460141}, DOI={10.1063/1.3460141}, number={26}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Choi, Jinsik and Kim, Jin-Soo and Hwang, Inrok and Hong, Sahwan and Byun, Ik-Su and Lee, Seung-Woong and Kang, Sung-Oong and Park, Bae Ho}, year={2010}, month=jun }