Crossref journal-article
AIP Publishing
Journal of Applied Physics (317)
Abstract

Adhesion and interfacial failure of Cr, Cu, and Cu/Cr films on a thin pyromellitic dianhydride-oxydianiline polyimide substrate have been investigated using a recently developed stretch deformation technique. This method directly measures the energy required to separate the interface from the difference in the load versus elongation curves between film/substrate and substrate structures. The failure mode was observed in combination with morphological studies by in situ optical microscopy and scanning and transmission electron microscopies. The stress distribution in the sample upon stretching has been computed by a finite element analysis. The difference in the stress relief modes, film fracture, and delamination behavior for Cu versus Cr films is discussed. The important role of crack formation in the metal overlayer for initiating failure is demonstrated. The effects due to the addition of a brittle Cr interface layer between polyimide and Cu on the buildup of stress and the onset of failure have also been investigated.

Bibliography

Faupel, F., Yang, C. H., Chen, S. T., & Ho, P. S. (1989). Adhesion and deformation of metal/polyimide layered structures. Journal of Applied Physics, 65(5), 1911–1917.

Authors 4
  1. F. Faupel (first)
  2. C. H. Yang (additional)
  3. S. T. Chen (additional)
  4. P. S. Ho (additional)
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Dates
Type When
Created 23 years ago (July 26, 2002, 9:07 a.m.)
Deposited 1 year, 6 months ago (Feb. 4, 2024, 4:23 a.m.)
Indexed 2 months ago (June 16, 2025, 9:07 a.m.)
Issued 36 years, 5 months ago (March 1, 1989)
Published 36 years, 5 months ago (March 1, 1989)
Published Print 36 years, 5 months ago (March 1, 1989)
Funders 0

None

@article{Faupel_1989, title={Adhesion and deformation of metal/polyimide layered structures}, volume={65}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.342903}, DOI={10.1063/1.342903}, number={5}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Faupel, F. and Yang, C. H. and Chen, S. T. and Ho, P. S.}, year={1989}, month=mar, pages={1911–1917} }