DOI: 10.1063/1.337642. Transient thermoreflectance from thin metal films

Transient thermoreflectance from thin metal films

10.1063/1.337642

Crossref journal-article

AIP Publishing

Journal of Applied Physics (317)

Abstract

This report describes the first demonstration of thermal diffusivity measurements using picosecond transient thermoreflectance (TTR). Although previously reported methods of measuring thermal transport properties of thin films require precise knowledge of the thermal properties of the substrate, this technique allows measurements on films as thin as 100 nm without any evidence of substrate interaction. The TTR measurement is modeled with a one-dimensional heat flow equation using a two-parameter fitting routine to determine the thermal diffusivity. The validity of our approach is confirmed by the TTR measured thermal diffusivity of single crystal nickel. We have also measured the thermal diffusivity of sputtered and evaporated single element metal films. Preliminary results from TTR measurements on compositionally modulated structures are also presented.

Bibliography

Paddock, C. A., & Eesley, G. L. (1986). Transient thermoreflectance from thin metal films. Journal of Applied Physics, 60(1), 285â290.

Authors 2

Carolyn A. Paddock (first)
Gary L. Eesley (additional)

References 20 Referenced 452

10.1103/PhysRevLett.51.2140 / Phys. Rev. Lett. (1983)
10.1103/PhysRevB.33.2144 / Phys. Rev. B (1986)
10.1364/OL.9.000093 / Opt. Lett. (1984)
10.1364/AO.22.003169 / Appl. Opt. (1983)
10.1063/1.95794 / Appl. Phys. Lett. (1985)
10.1063/1.335713 / J. Appl. Phys. (1985)
10.1063/1.334472 / J. Appl. Phys. (1985)
10.1063/1.331250 / J. Appl. Phys. (1982)
10.1063/1.336690 / J. Appl. Phys. (1986)
10.1063/1.1661506 / J. Appl. Phys. (1972)
{'key': '2024020405131498300_r11', 'first-page': '1285', 'volume': 'QE-17', 'year': '1981', 'journal-title': 'IEEE J. Quantum. Electron.'} / IEEE J. Quantum. Electron. (1981)
10.1063/1.321760 / J. Appl. Phys. (1975)
10.1093/comjnl/7.4.308 / Comput. J. (1965)
{'key': '2024020405131498300_r14'}
{'key': '2024020405131498300_r15'}
10.1063/1.94071 / Appl. Phys. Lett. (1983)
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{'key': '2024020405131498300_r19'}
{'key': '2024020405131498300_r20'}

Dates

Type	When
Created	23 years, 1 month ago (July 26, 2002, 8:53 a.m.)
Deposited	1 year, 7 months ago (Feb. 4, 2024, 12:13 a.m.)
Indexed	1 week ago (Aug. 30, 2025, 1 p.m.)
Issued	39 years, 2 months ago (July 1, 1986)
Published	39 years, 2 months ago (July 1, 1986)
Published Print	39 years, 2 months ago (July 1, 1986)

Funders 0

None

BibTeX

@article{Paddock_1986, title={Transient thermoreflectance from thin metal films}, volume={60}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.337642}, DOI={10.1063/1.337642}, number={1}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Paddock, Carolyn A. and Eesley, Gary L.}, year={1986}, month=jul, pages={285–290} }

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