DOI: 10.1063/1.3372621. Coaxial atomic force microscope tweezers

Coaxial atomic force microscope tweezers

10.1063/1.3372621

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

We demonstrate coaxial atomic force microscope (AFM) tweezers that can trap and place small objects using dielectrophoresis (DEP). An attractive force is generated at the tip of a coaxial AFM probe by applying a radio frequency voltage between the center conductor and a grounded shield; the origin of the force is found to be DEP by measuring the pull-off force versus applied voltage. We show that the coaxial AFM tweezers can perform three-dimensional assembly by picking up a specified silica microsphere, imaging with the microsphere at the end of the tip, and placing it at a target destination.

Bibliography

Brown, K. A., Aguilar, J. A., & Westervelt, R. M. (2010). Coaxial atomic force microscope tweezers. Applied Physics Letters, 96(12).

Authors 3

K. A. Brown (first)
J. A. Aguilar (additional)
R. M. Westervelt (additional)

References 19 Referenced 12

10.1103/RevModPhys.75.949 / Rev. Mod. Phys. (2003)
10.1116/1.1926293 / J. Vac. Sci. Technol. B (2005)
10.1038/nnano.2007.39 / Nat. Nanotechnol. (2007)
10.1109/JPROC.2003.818333 / Proc. IEEE (2003)
10.1115/1.4000139 / J. Dyn. Syst., Meas., Control (2009)
10.1088/0960-1317/19/7/075009 / J. Micromech. Microeng. (2009)
10.1088/0957-4484/20/21/215301 / Nanotechnology (2009)
10.1126/science.286.5447.2148 / Science (1999)
10.1063/1.1403275 / Appl. Phys. Lett. (2001)
10.1146/annurev.bioeng.8.061505.095739 / Annu. Rev. Biomed. Eng. (2006)
10.1088/0957-4484/11/2/314 / Nanotechnology (2000)
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10.1088/0957-4484/10/1/012 / Nanotechnology (1999)
10.1117/12.478191 / Proc. SPIE (2003)
{'key': '2023062215531312300_c15', 'first-page': '5', 'volume-title': 'American Institute of Physics Handbook', 'year': '1982', 'edition': '3rd ed.'} / American Institute of Physics Handbook (1982)
10.1103/PhysRevLett.83.3328 / Phys. Rev. Lett. (1999)
10.1016/S0001-8686(01)00082-3 / Adv. Colloid Interface Sci. (2002)
10.1088/0957-4484/20/38/385302 / Nanotechnology (2009)
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Dates

Type	When
Created	15 years, 5 months ago (March 25, 2010, 6:39 p.m.)
Deposited	2 years, 2 months ago (June 22, 2023, 8:45 p.m.)
Indexed	1 month ago (July 30, 2025, 6:54 a.m.)
Issued	15 years, 5 months ago (March 22, 2010)
Published	15 years, 5 months ago (March 22, 2010)
Published Online	15 years, 5 months ago (March 24, 2010)
Published Print	15 years, 5 months ago (March 22, 2010)

Funders 0

None

BibTeX

@article{Brown_2010, title={Coaxial atomic force microscope tweezers}, volume={96}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.3372621}, DOI={10.1063/1.3372621}, number={12}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Brown, K. A. and Aguilar, J. A. and Westervelt, R. M.}, year={2010}, month=mar }

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