Crossref journal-article
AIP Publishing
Applied Physics Letters (317)
Abstract

We have used scanning gate microscopy to explore the local conductivity of a current-annealed graphene flake. A map of the local neutrality point (NP) after annealing at low current density exhibits micron-sized inhomogeneities. Broadening of the local e-h transition is also correlated with the inhomogeneity of the NP. Annealing at higher current density reduces the NP inhomogeneity, but we still observe some asymmetry in the e-h conduction. We attribute this to a hole-doped domain close to one of the metal contacts combined with underlying striations in the local NP.

Bibliography

Connolly, M. R., Chiou, K. L., Smith, C. G., Anderson, D., Jones, G. A. C., Lombardo, A., Fasoli, A., & Ferrari, A. C. (2010). Scanning gate microscopy of current-annealed single layer graphene. Applied Physics Letters, 96(11).

Authors 8
  1. M. R. Connolly (first)
  2. K. L. Chiou (additional)
  3. C. G. Smith (additional)
  4. D. Anderson (additional)
  5. G. A. C. Jones (additional)
  6. A. Lombardo (additional)
  7. A. Fasoli (additional)
  8. A. C. Ferrari (additional)
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Dates
Type When
Created 15 years, 5 months ago (March 16, 2010, 11:27 a.m.)
Deposited 2 years, 2 months ago (July 2, 2023, 7:26 p.m.)
Indexed 1 month ago (July 30, 2025, 6:55 a.m.)
Issued 15 years, 5 months ago (March 15, 2010)
Published 15 years, 5 months ago (March 15, 2010)
Published Online 15 years, 5 months ago (March 15, 2010)
Published Print 15 years, 5 months ago (March 15, 2010)
Funders 0

None

@article{Connolly_2010, title={Scanning gate microscopy of current-annealed single layer graphene}, volume={96}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.3327829}, DOI={10.1063/1.3327829}, number={11}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Connolly, M. R. and Chiou, K. L. and Smith, C. G. and Anderson, D. and Jones, G. A. C. and Lombardo, A. and Fasoli, A. and Ferrari, A. C.}, year={2010}, month=mar }