Crossref journal-article
AIP Publishing
Applied Physics Letters (317)
Abstract

Single postdielectric resonators operating on their quasi TE011 modes were used for the measurement of the surface resistance and conductivity of graphene films grown on semi-insulating SiC substrates. With this technique the surface resistance was measured with an uncertainty of ±5% and the conductivity was evaluated with an uncertainty equal to the uncertainty in determining the film thickness. The room temperature conductivity of the graphene films proved to be in the range 5×106 to 6.4×106 S/m.

Bibliography

Krupka, J., & Strupinski, W. (2010). Measurements of the sheet resistance and conductivity of thin epitaxial graphene and SiC films. Applied Physics Letters, 96(8).

Authors 2
  1. J. Krupka (first)
  2. W. Strupinski (additional)
References 8 Referenced 105
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Dates
Type When
Created 15 years, 6 months ago (Feb. 24, 2010, 10:25 a.m.)
Deposited 2 years, 1 month ago (June 27, 2023, 11:26 p.m.)
Indexed 2 weeks, 4 days ago (Aug. 6, 2025, 9:26 a.m.)
Issued 15 years, 6 months ago (Feb. 22, 2010)
Published 15 years, 6 months ago (Feb. 22, 2010)
Published Online 15 years, 6 months ago (Feb. 23, 2010)
Published Print 15 years, 6 months ago (Feb. 22, 2010)
Funders 0

None

@article{Krupka_2010, title={Measurements of the sheet resistance and conductivity of thin epitaxial graphene and SiC films}, volume={96}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.3327334}, DOI={10.1063/1.3327334}, number={8}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Krupka, J. and Strupinski, W.}, year={2010}, month=feb }